Effect of microwave treatment on current flow mechanism in ohmic contacts to GaN

The temperature dependence of contact resistivity ρс of Ti-Al-TiB₂-Au ohmic contacts to n-GaN and effect of microwave treatment on ρс are investigated. The obtained dependences are described using a model of current flow via metal shunts associated with dislocations, the current being limited by...

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Бібліографічні деталі
Дата:2013
Автор: Sheremet, V.N.
Формат: Стаття
Мова:English
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2013
Назва видання:Semiconductor Physics Quantum Electronics & Optoelectronics
Онлайн доступ:http://dspace.nbuv.gov.ua/handle/123456789/117729
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Effect of microwave treatment on current flow mechanism in ohmic contacts to GaN / V.N. Sheremet // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2013. — Т. 16, № 3. — С. 280-284. — Бібліогр.: 14 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id irk-123456789-117729
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spelling irk-123456789-1177292017-05-27T03:04:20Z Effect of microwave treatment on current flow mechanism in ohmic contacts to GaN Sheremet, V.N. The temperature dependence of contact resistivity ρс of Ti-Al-TiB₂-Au ohmic contacts to n-GaN and effect of microwave treatment on ρс are investigated. The obtained dependences are described using a model of current flow via metal shunts associated with dislocations, the current being limited by diffusion supply of electrons. It is shown that microwave treatment increases the dislocation density in the near-contact region of contact structure and reduces the relative spread of resistivity values of contacts formed on the wafer. 2013 Article Effect of microwave treatment on current flow mechanism in ohmic contacts to GaN / V.N. Sheremet // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2013. — Т. 16, № 3. — С. 280-284. — Бібліогр.: 14 назв. — англ. 1560-8034 PACS 73.40.Cg, Ns; 85.40.-e http://dspace.nbuv.gov.ua/handle/123456789/117729 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
language English
description The temperature dependence of contact resistivity ρс of Ti-Al-TiB₂-Au ohmic contacts to n-GaN and effect of microwave treatment on ρс are investigated. The obtained dependences are described using a model of current flow via metal shunts associated with dislocations, the current being limited by diffusion supply of electrons. It is shown that microwave treatment increases the dislocation density in the near-contact region of contact structure and reduces the relative spread of resistivity values of contacts formed on the wafer.
format Article
author Sheremet, V.N.
spellingShingle Sheremet, V.N.
Effect of microwave treatment on current flow mechanism in ohmic contacts to GaN
Semiconductor Physics Quantum Electronics & Optoelectronics
author_facet Sheremet, V.N.
author_sort Sheremet, V.N.
title Effect of microwave treatment on current flow mechanism in ohmic contacts to GaN
title_short Effect of microwave treatment on current flow mechanism in ohmic contacts to GaN
title_full Effect of microwave treatment on current flow mechanism in ohmic contacts to GaN
title_fullStr Effect of microwave treatment on current flow mechanism in ohmic contacts to GaN
title_full_unstemmed Effect of microwave treatment on current flow mechanism in ohmic contacts to GaN
title_sort effect of microwave treatment on current flow mechanism in ohmic contacts to gan
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
publishDate 2013
url http://dspace.nbuv.gov.ua/handle/123456789/117729
citation_txt Effect of microwave treatment on current flow mechanism in ohmic contacts to GaN / V.N. Sheremet // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2013. — Т. 16, № 3. — С. 280-284. — Бібліогр.: 14 назв. — англ.
series Semiconductor Physics Quantum Electronics & Optoelectronics
work_keys_str_mv AT sheremetvn effectofmicrowavetreatmentoncurrentflowmechanisminohmiccontactstogan
first_indexed 2023-10-18T20:30:29Z
last_indexed 2023-10-18T20:30:29Z
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