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2025-02-23T04:23:09-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: => GET http://localhost:8983/solr/biblio/select?fl=%2A&wt=json&json.nl=arrarr&q=id%3A%22irk-123456789-117741%22&qt=morelikethis&rows=5
2025-02-23T04:23:09-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: <= 200 OK
2025-02-23T04:23:09-05:00 DEBUG: Deserialized SOLR response
Ultrasonic assisted nanomanipulations with atomic force microscope

Ultrasonic assisted nanomanipulations with atomic force microscope

Demonstrated experimentally in this work was the possibility of controlled handling the nanoparticles with the size from 50 up to 250 nm on a semiconductor surface by using an atomic force microscope under conditions of acoustic excitation. It has been shown that the selective transport of par...

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Bibliographic Details
Main Authors: Lytvyn, P.M., Olikh, O.Ya., Lytvyn, O.S., Dyachyns’ka, O.M., Prokopenko, I.V.
Format: Article
Language:English
Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2010
Series:Semiconductor Physics Quantum Electronics & Optoelectronics
Online Access:http://dspace.nbuv.gov.ua/handle/123456789/117741
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Summary:Demonstrated experimentally in this work was the possibility of controlled handling the nanoparticles with the size from 50 up to 250 nm on a semiconductor surface by using an atomic force microscope under conditions of acoustic excitation. It has been shown that the selective transport of particles of a certain size is possible owing to the change of an ultrasonic vibration amplitude. Also in this study, possible mechanisms in which ultrasound may influence the particle-surface interaction and the probe-particle (surface) interaction have been analyzed.

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