Tunneling current via dislocations in InAs and InSb infrared photodiodes
Carrier transport mechanisms are investigated in InAs and InSb infrared photodiodes. The photodiodes were prepared by thermal diffusion of Cd and ion implantation of Be into InAs and InSb single-crystal substrates of n-type conductivity, respectively. The direct current was measured as a function...
Збережено в:
| Дата: | 2011 |
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| Автори: | , , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2011
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| Назва видання: | Semiconductor Physics Quantum Electronics & Optoelectronics |
| Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/117788 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Tunneling current via dislocations in InAs and InSb infrared photodiodes / A.V. Sukach, V.V. Tetyorkin and N.M. Krolevec // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2011. — Т. 14, № 4. — С. 416-420. — Бібліогр.: 27 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| Резюме: | Carrier transport mechanisms are investigated in InAs and InSb infrared
photodiodes. The photodiodes were prepared by thermal diffusion of Cd and ion
implantation of Be into InAs and InSb single-crystal substrates of n-type conductivity,
respectively. The direct current was measured as a function of bias voltage and
temperature. The excess tunneling current is observed in the investigated photodiodes at
small forward bias voltages. Experimental proofs are obtained that dislocations are
responsible for this current. A model for the tunneling current via dislocations is briefly
discussed. |
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