High-power low-frequency current oscillations in germanium samples

Experimental investigation of high-power low-frequency current oscillations in germanium samples with low injecting contacts is discussed in this article. The results obtained were explained by periodic formation, transport along the sample, and collapse of the thermal gradient-drift (TGD) domain. T...

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Дата:2003
Автор: Pavljuk, S.P.
Формат: Стаття
Мова:English
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2003
Назва видання:Semiconductor Physics Quantum Electronics & Optoelectronics
Онлайн доступ:http://dspace.nbuv.gov.ua/handle/123456789/117868
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:High-power low-frequency current oscillations in germanium samples / S.P. Pavljuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 1. — С. 19-22. — Бібліогр.: 3 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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spelling irk-123456789-1178682017-05-28T03:03:38Z High-power low-frequency current oscillations in germanium samples Pavljuk, S.P. Experimental investigation of high-power low-frequency current oscillations in germanium samples with low injecting contacts is discussed in this article. The results obtained were explained by periodic formation, transport along the sample, and collapse of the thermal gradient-drift (TGD) domain. The domain formation mechanism is considered in details in [1]. 2003 Article High-power low-frequency current oscillations in germanium samples / S.P. Pavljuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 1. — С. 19-22. — Бібліогр.: 3 назв. — англ. 1560-8034 PACS: 72.20.-i PACS: 72.80.Cw http://dspace.nbuv.gov.ua/handle/123456789/117868 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
language English
description Experimental investigation of high-power low-frequency current oscillations in germanium samples with low injecting contacts is discussed in this article. The results obtained were explained by periodic formation, transport along the sample, and collapse of the thermal gradient-drift (TGD) domain. The domain formation mechanism is considered in details in [1].
format Article
author Pavljuk, S.P.
spellingShingle Pavljuk, S.P.
High-power low-frequency current oscillations in germanium samples
Semiconductor Physics Quantum Electronics & Optoelectronics
author_facet Pavljuk, S.P.
author_sort Pavljuk, S.P.
title High-power low-frequency current oscillations in germanium samples
title_short High-power low-frequency current oscillations in germanium samples
title_full High-power low-frequency current oscillations in germanium samples
title_fullStr High-power low-frequency current oscillations in germanium samples
title_full_unstemmed High-power low-frequency current oscillations in germanium samples
title_sort high-power low-frequency current oscillations in germanium samples
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
publishDate 2003
url http://dspace.nbuv.gov.ua/handle/123456789/117868
citation_txt High-power low-frequency current oscillations in germanium samples / S.P. Pavljuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 1. — С. 19-22. — Бібліогр.: 3 назв. — англ.
series Semiconductor Physics Quantum Electronics & Optoelectronics
work_keys_str_mv AT pavljuksp highpowerlowfrequencycurrentoscillationsingermaniumsamples
first_indexed 2023-10-18T20:30:52Z
last_indexed 2023-10-18T20:30:52Z
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