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Optical characterization of thin Au films by standard and polaritonic ellipsometry

Optical characterization of thin Au films by standard and polaritonic ellipsometry

This work is aimed at optical characterization of thin Au films by multiple-angle-of-incidence reflectance ellipsometry at the fixed wavelength (632.8 nm) in standard and attenuated total reflection (ATR) modes in contact with different dielectric media (water, alcohol and air). The comparative expe...

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Bibliographic Details
Main Authors: Dmitruk, N.L., Fursenko, O.V., Kondratenko, O.S., Romanyuk, V.R.
Format: Article
Language:English
Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2003
Series:Semiconductor Physics Quantum Electronics & Optoelectronics
Online Access:http://dspace.nbuv.gov.ua/handle/123456789/118041
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http://dspace.nbuv.gov.ua/handle/123456789/118041

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