Exciton effects in band-edge electroluminescence of silicon barrier structures

A theoretical analysis of the band-edge electroluminescence efficiency in silicon diodes and p-i-n-structures has been made. We have shown that maximal possible efficiency can achieve 10 % both at room and liquid nitrogen temperatures. Maximal values of the efficiency are restricted by the interband...

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Бібліографічні деталі
Дата:2004
Автори: Sachenko, A.V., Gorban, A.P., Korbutyak, D.V., Kostylyov, V.P., Kryuchenko, Yu.V., Chernenko, V.V.
Формат: Стаття
Мова:English
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2004
Назва видання:Semiconductor Physics Quantum Electronics & Optoelectronics
Онлайн доступ:http://dspace.nbuv.gov.ua/handle/123456789/118104
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Exciton effects in band-edge electroluminescence of silicon barrier structures / A.V. Sachenko, A.P. Gorban, D.V. Korbutyak, V.P. Kostylyov, Yu.V. Kryuchenko, V.V. Chernenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2004. — Т. 7, № 1. — С. 1-7. — Бібліогр.: 20 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id irk-123456789-118104
record_format dspace
spelling irk-123456789-1181042017-05-29T03:03:18Z Exciton effects in band-edge electroluminescence of silicon barrier structures Sachenko, A.V. Gorban, A.P. Korbutyak, D.V. Kostylyov, V.P. Kryuchenko, Yu.V. Chernenko, V.V. A theoretical analysis of the band-edge electroluminescence efficiency in silicon diodes and p-i-n-structures has been made. We have shown that maximal possible efficiency can achieve 10 % both at room and liquid nitrogen temperatures. Maximal values of the efficiency are restricted by the interband Auger recombination process. It is found that electroluminescence efficiency decreases rapidly with the decrease of characteristic Shockley- Reed-Hall nonradiative lifetime for minority carriers. It is shown that even at room temperatures the main contribution into the edge electroluminescence in silicon barrier structures is given by excitonic effects. Dark I-V characteristics of directly biased silicon diodes measured both at room and nitrogen temperatures are used to explain anomalous temperature dependencies of silicon diode electroluminescence. 2004 Article Exciton effects in band-edge electroluminescence of silicon barrier structures / A.V. Sachenko, A.P. Gorban, D.V. Korbutyak, V.P. Kostylyov, Yu.V. Kryuchenko, V.V. Chernenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2004. — Т. 7, № 1. — С. 1-7. — Бібліогр.: 20 назв. — англ. 1560-8034 PACS: 71.35.-y, 72.20.jv, 78.20.-e, 78.60.-b, 78.60.Fi http://dspace.nbuv.gov.ua/handle/123456789/118104 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
language English
description A theoretical analysis of the band-edge electroluminescence efficiency in silicon diodes and p-i-n-structures has been made. We have shown that maximal possible efficiency can achieve 10 % both at room and liquid nitrogen temperatures. Maximal values of the efficiency are restricted by the interband Auger recombination process. It is found that electroluminescence efficiency decreases rapidly with the decrease of characteristic Shockley- Reed-Hall nonradiative lifetime for minority carriers. It is shown that even at room temperatures the main contribution into the edge electroluminescence in silicon barrier structures is given by excitonic effects. Dark I-V characteristics of directly biased silicon diodes measured both at room and nitrogen temperatures are used to explain anomalous temperature dependencies of silicon diode electroluminescence.
format Article
author Sachenko, A.V.
Gorban, A.P.
Korbutyak, D.V.
Kostylyov, V.P.
Kryuchenko, Yu.V.
Chernenko, V.V.
spellingShingle Sachenko, A.V.
Gorban, A.P.
Korbutyak, D.V.
Kostylyov, V.P.
Kryuchenko, Yu.V.
Chernenko, V.V.
Exciton effects in band-edge electroluminescence of silicon barrier structures
Semiconductor Physics Quantum Electronics & Optoelectronics
author_facet Sachenko, A.V.
Gorban, A.P.
Korbutyak, D.V.
Kostylyov, V.P.
Kryuchenko, Yu.V.
Chernenko, V.V.
author_sort Sachenko, A.V.
title Exciton effects in band-edge electroluminescence of silicon barrier structures
title_short Exciton effects in band-edge electroluminescence of silicon barrier structures
title_full Exciton effects in band-edge electroluminescence of silicon barrier structures
title_fullStr Exciton effects in band-edge electroluminescence of silicon barrier structures
title_full_unstemmed Exciton effects in band-edge electroluminescence of silicon barrier structures
title_sort exciton effects in band-edge electroluminescence of silicon barrier structures
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
publishDate 2004
url http://dspace.nbuv.gov.ua/handle/123456789/118104
citation_txt Exciton effects in band-edge electroluminescence of silicon barrier structures / A.V. Sachenko, A.P. Gorban, D.V. Korbutyak, V.P. Kostylyov, Yu.V. Kryuchenko, V.V. Chernenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2004. — Т. 7, № 1. — С. 1-7. — Бібліогр.: 20 назв. — англ.
series Semiconductor Physics Quantum Electronics & Optoelectronics
work_keys_str_mv AT sachenkoav excitoneffectsinbandedgeelectroluminescenceofsiliconbarrierstructures
AT gorbanap excitoneffectsinbandedgeelectroluminescenceofsiliconbarrierstructures
AT korbutyakdv excitoneffectsinbandedgeelectroluminescenceofsiliconbarrierstructures
AT kostylyovvp excitoneffectsinbandedgeelectroluminescenceofsiliconbarrierstructures
AT kryuchenkoyuv excitoneffectsinbandedgeelectroluminescenceofsiliconbarrierstructures
AT chernenkovv excitoneffectsinbandedgeelectroluminescenceofsiliconbarrierstructures
first_indexed 2023-10-18T20:31:21Z
last_indexed 2023-10-18T20:31:21Z
_version_ 1796150420471545856