The influence of size effects on thin films local piezoelectric response of thin films
We discuss the influence of size effects on the local piezoelectric response of thin films. In calculations of the electrostatic potential in the triple system “PFM probe tip – film – substrate,” the effective point charge model is used. The obtained expressions for the local piezoelectric respon...
Збережено в:
| Дата: | 2007 |
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| Автори: | , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2007
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| Назва видання: | Semiconductor Physics Quantum Electronics & Optoelectronics |
| Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/118331 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | The influence of size effects on thin films local piezoelectric response of thin films / A.N. Morozovska, S.V. Svechnikov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2007. — Т. 10, № 4. — С.36-41. — Бібліогр.: 17 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| Резюме: | We discuss the influence of size effects on the local piezoelectric response of
thin films. In calculations of the electrostatic potential in the triple system “PFM probe tip –
film – substrate,” the effective point charge model is used. The obtained expressions for the
local piezoelectric response of a surface layer (film) capped are intended for the
calculations of Piezoresponse Force Microscopy signals of thin polar films epitaxially
grown on thick substrates. Theoretical predictions are in qualitative agreement with typical
experimental results obtained for perovskite Pb(Zr,
Ti)O₃ and multiferroic BiFeO₃ films. |
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