Polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties

Polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties

Adduced in this work are the results of investigation aimed at analysis of coordinate distributions for azimuths and ellipticity of polarization (polarization maps) in laser images of three types of phase-inhomogeneous layers (PhIL), namely: rough, ground and bulk scattering layers. To characteri...

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Видавець:Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Дата:2010
Автори: Ushenko, Yu.O., Misevich, I.Z., Angelsky, A.P., Bachinsky, V.T., Telen’ga, O.Yu., Olar, O.I.
Формат: Стаття
Мова:English
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2010
Назва видання:Semiconductor Physics Quantum Electronics & Optoelectronics
Онлайн доступ:http://dspace.nbuv.gov.ua/handle/123456789/118397
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Цитувати:Polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties / Yu.O. Ushenko, I.Z. Misevich, A.P. Angelsky, V.T. Bachinsky, O.Yu. Telen’ga, O.I. Olar // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 3. — С. 248-258. — Бібліогр.: 43 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id irk-123456789-118397
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spelling irk-123456789-1183972017-05-31T03:06:13Z Polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties Ushenko, Yu.O. Misevich, I.Z. Angelsky, A.P. Bachinsky, V.T. Telen’ga, O.Yu. Olar, O.I. Adduced in this work are the results of investigation aimed at analysis of coordinate distributions for azimuths and ellipticity of polarization (polarization maps) in laser images of three types of phase-inhomogeneous layers (PhIL), namely: rough, ground and bulk scattering layers. To characterize polarization maps for all the types of PhIL, the authors have offered to use three groups of parameters: statistical moments of the first to fourth orders, autocorrelation functions, logarithmic dependences for power spectra related to distributions of azimuths and ellipticity of polarization inherent to PhIL laser images. Ascertained are the criteria for diagnostics and classification of PhIL optical properties. 2010 Article Polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties / Yu.O. Ushenko, I.Z. Misevich, A.P. Angelsky, V.T. Bachinsky, O.Yu. Telen’ga, O.I. Olar // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 3. — С. 248-258. — Бібліогр.: 43 назв. — англ. 1560-8034 PACS 87.64.-t http://dspace.nbuv.gov.ua/handle/123456789/118397 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
language English
description Adduced in this work are the results of investigation aimed at analysis of coordinate distributions for azimuths and ellipticity of polarization (polarization maps) in laser images of three types of phase-inhomogeneous layers (PhIL), namely: rough, ground and bulk scattering layers. To characterize polarization maps for all the types of PhIL, the authors have offered to use three groups of parameters: statistical moments of the first to fourth orders, autocorrelation functions, logarithmic dependences for power spectra related to distributions of azimuths and ellipticity of polarization inherent to PhIL laser images. Ascertained are the criteria for diagnostics and classification of PhIL optical properties.
format Article
author Ushenko, Yu.O.
Misevich, I.Z.
Angelsky, A.P.
Bachinsky, V.T.
Telen’ga, O.Yu.
Olar, O.I.
spellingShingle Ushenko, Yu.O.
Misevich, I.Z.
Angelsky, A.P.
Bachinsky, V.T.
Telen’ga, O.Yu.
Olar, O.I.
Polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties
Semiconductor Physics Quantum Electronics & Optoelectronics
author_facet Ushenko, Yu.O.
Misevich, I.Z.
Angelsky, A.P.
Bachinsky, V.T.
Telen’ga, O.Yu.
Olar, O.I.
author_sort Ushenko, Yu.O.
title Polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties
title_short Polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties
title_full Polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties
title_fullStr Polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties
title_full_unstemmed Polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties
title_sort polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
publishDate 2010
url http://dspace.nbuv.gov.ua/handle/123456789/118397
citation_txt Polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties / Yu.O. Ushenko, I.Z. Misevich, A.P. Angelsky, V.T. Bachinsky, O.Yu. Telen’ga, O.I. Olar // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 3. — С. 248-258. — Бібліогр.: 43 назв. — англ.
series Semiconductor Physics Quantum Electronics & Optoelectronics
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first_indexed 2023-10-18T20:32:02Z
last_indexed 2023-10-18T20:32:02Z
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