Polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties
Adduced in this work are the results of investigation aimed at analysis of coordinate distributions for azimuths and ellipticity of polarization (polarization maps) in laser images of three types of phase-inhomogeneous layers (PhIL), namely: rough, ground and bulk scattering layers. To characteri...
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Дата: | 2010 |
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Автори: | , , , , , |
Формат: | Стаття |
Мова: | English |
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Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2010
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Назва видання: | Semiconductor Physics Quantum Electronics & Optoelectronics |
Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/118397 |
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Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
Цитувати: | Polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties / Yu.O. Ushenko, I.Z. Misevich, A.P. Angelsky, V.T. Bachinsky, O.Yu. Telen’ga, O.I. Olar // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 3. — С. 248-258. — Бібліогр.: 43 назв. — англ. |
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irk-123456789-1183972017-05-31T03:06:13Z Polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties Ushenko, Yu.O. Misevich, I.Z. Angelsky, A.P. Bachinsky, V.T. Telen’ga, O.Yu. Olar, O.I. Adduced in this work are the results of investigation aimed at analysis of coordinate distributions for azimuths and ellipticity of polarization (polarization maps) in laser images of three types of phase-inhomogeneous layers (PhIL), namely: rough, ground and bulk scattering layers. To characterize polarization maps for all the types of PhIL, the authors have offered to use three groups of parameters: statistical moments of the first to fourth orders, autocorrelation functions, logarithmic dependences for power spectra related to distributions of azimuths and ellipticity of polarization inherent to PhIL laser images. Ascertained are the criteria for diagnostics and classification of PhIL optical properties. 2010 Article Polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties / Yu.O. Ushenko, I.Z. Misevich, A.P. Angelsky, V.T. Bachinsky, O.Yu. Telen’ga, O.I. Olar // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 3. — С. 248-258. — Бібліогр.: 43 назв. — англ. 1560-8034 PACS 87.64.-t http://dspace.nbuv.gov.ua/handle/123456789/118397 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
collection |
DSpace DC |
language |
English |
description |
Adduced in this work are the results of investigation aimed at analysis of
coordinate distributions for azimuths and ellipticity of polarization (polarization maps) in
laser images of three types of phase-inhomogeneous layers (PhIL), namely: rough,
ground and bulk scattering layers. To characterize polarization maps for all the types of
PhIL, the authors have offered to use three groups of parameters: statistical moments of
the first to fourth orders, autocorrelation functions, logarithmic dependences for power
spectra related to distributions of azimuths and ellipticity of polarization inherent to PhIL
laser images. Ascertained are the criteria for diagnostics and classification of PhIL
optical properties. |
format |
Article |
author |
Ushenko, Yu.O. Misevich, I.Z. Angelsky, A.P. Bachinsky, V.T. Telen’ga, O.Yu. Olar, O.I. |
spellingShingle |
Ushenko, Yu.O. Misevich, I.Z. Angelsky, A.P. Bachinsky, V.T. Telen’ga, O.Yu. Olar, O.I. Polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties Semiconductor Physics Quantum Electronics & Optoelectronics |
author_facet |
Ushenko, Yu.O. Misevich, I.Z. Angelsky, A.P. Bachinsky, V.T. Telen’ga, O.Yu. Olar, O.I. |
author_sort |
Ushenko, Yu.O. |
title |
Polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties |
title_short |
Polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties |
title_full |
Polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties |
title_fullStr |
Polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties |
title_full_unstemmed |
Polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties |
title_sort |
polarization-singular structure in laser images of phase-inhomogeneous layers to diagnose and classify their optical properties |
publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
publishDate |
2010 |
url |
http://dspace.nbuv.gov.ua/handle/123456789/118397 |
citation_txt |
Polarization-singular structure in laser images
of phase-inhomogeneous layers to diagnose
and classify their optical properties / Yu.O. Ushenko, I.Z. Misevich, A.P. Angelsky, V.T. Bachinsky, O.Yu. Telen’ga, O.I. Olar // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 3. — С. 248-258. — Бібліогр.: 43 назв. — англ. |
series |
Semiconductor Physics Quantum Electronics & Optoelectronics |
work_keys_str_mv |
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first_indexed |
2023-10-18T20:32:02Z |
last_indexed |
2023-10-18T20:32:02Z |
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