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Occupation preference values in doped CmIm' multinaries from EXAFS and FTIR correlative analysis

Occupation preference values in doped CmIm' multinaries from EXAFS and FTIR correlative analysis

We discuss which x-ray absorption fine structure (EXAFS) data of binary doped CmIm' compound structures can be unfolded to determine elemental bond distances and the deviations from random configurations due to site preference occupations (SOPs). SOP-deviation estimations can be further confirm...

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Bibliographic Details
Main Authors: Robouch, B.V., Marcelli, A., Robouch, P., Kisiel, A.
Format: Article
Language:English
Published: Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України 2011
Series:Физика низких температур
Subjects:
XVIII Уральская международная зимняя школа по физике полупроводников
Online Access:http://dspace.nbuv.gov.ua/handle/123456789/118525
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http://dspace.nbuv.gov.ua/handle/123456789/118525

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