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Glass formation region and X-ray analysis of the glassy alloys in AgGaSe₂+GeS₂<=>AgGaS₂+GeSe₂ system
A region of glass formation was found during melt quenching from 1273 K in the AgGaSe₂+GeS₂<=>AgGaS₂+GeSe₂. system. It is localized along the binary GeSe₂- GeS₂ system. Characteristic parameters (Tg, Tc, Tm) were determined for the glassy alloys, and Tgr and KG were calculated using them. T...
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Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2009
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Series: | Semiconductor Physics Quantum Electronics & Optoelectronics |
Online Access: | http://dspace.nbuv.gov.ua/handle/123456789/118689 |
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irk-123456789-1186892017-05-31T03:10:27Z Glass formation region and X-ray analysis of the glassy alloys in AgGaSe₂+GeS₂<=>AgGaS₂+GeSe₂ system Halyan, V.V. Shevchuk, M.V. Davydyuk, G.Ye. Voronyuk, S.V. Kevshyn, A.H. Bulatetsky, V.V. A region of glass formation was found during melt quenching from 1273 K in the AgGaSe₂+GeS₂<=>AgGaS₂+GeSe₂. system. It is localized along the binary GeSe₂- GeS₂ system. Characteristic parameters (Tg, Tc, Tm) were determined for the glassy alloys, and Tgr and KG were calculated using them. The radial distribution functions were calculated using the integral Fourier transformation based on X-ray scattering curves. The average interatomic distances within the first and second coordination spheres were determined. 2009 Article Glass formation region and X-ray analysis of the glassy alloys in AgGaSe₂+GeS₂<=>AgGaS₂+GeSe₂ system / V.V. Halyan, M.V. Shevchuk, G.Ye. Davydyuk, S.V. Voronyuk, A.H. Kevshyn, V.V. Bulatetsky // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2009. — Т. 12, № 2. — С. 138-142. — Бібліогр.: 14 назв. — англ. 1560-8034 PACS 61.43.Fs http://dspace.nbuv.gov.ua/handle/123456789/118689 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine |
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English |
description |
A region of glass formation was found during melt quenching from 1273 K in
the AgGaSe₂+GeS₂<=>AgGaS₂+GeSe₂. system. It is localized along the binary GeSe₂-
GeS₂ system. Characteristic parameters (Tg, Tc, Tm) were determined for the glassy
alloys, and Tgr and KG were calculated using them. The radial distribution functions were
calculated using the integral Fourier transformation based on X-ray scattering curves.
The average interatomic distances within the first and second coordination spheres were
determined. |
format |
Article |
author |
Halyan, V.V. Shevchuk, M.V. Davydyuk, G.Ye. Voronyuk, S.V. Kevshyn, A.H. Bulatetsky, V.V. |
spellingShingle |
Halyan, V.V. Shevchuk, M.V. Davydyuk, G.Ye. Voronyuk, S.V. Kevshyn, A.H. Bulatetsky, V.V. Glass formation region and X-ray analysis of the glassy alloys in AgGaSe₂+GeS₂<=>AgGaS₂+GeSe₂ system Semiconductor Physics Quantum Electronics & Optoelectronics |
author_facet |
Halyan, V.V. Shevchuk, M.V. Davydyuk, G.Ye. Voronyuk, S.V. Kevshyn, A.H. Bulatetsky, V.V. |
author_sort |
Halyan, V.V. |
title |
Glass formation region and X-ray analysis of the glassy alloys in AgGaSe₂+GeS₂<=>AgGaS₂+GeSe₂ system |
title_short |
Glass formation region and X-ray analysis of the glassy alloys in AgGaSe₂+GeS₂<=>AgGaS₂+GeSe₂ system |
title_full |
Glass formation region and X-ray analysis of the glassy alloys in AgGaSe₂+GeS₂<=>AgGaS₂+GeSe₂ system |
title_fullStr |
Glass formation region and X-ray analysis of the glassy alloys in AgGaSe₂+GeS₂<=>AgGaS₂+GeSe₂ system |
title_full_unstemmed |
Glass formation region and X-ray analysis of the glassy alloys in AgGaSe₂+GeS₂<=>AgGaS₂+GeSe₂ system |
title_sort |
glass formation region and x-ray analysis of the glassy alloys in aggase₂+ges₂<=>aggas₂+gese₂ system |
publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
publishDate |
2009 |
url |
http://dspace.nbuv.gov.ua/handle/123456789/118689 |
citation_txt |
Glass formation region and X-ray analysis of the glassy alloys in AgGaSe₂+GeS₂<=>AgGaS₂+GeSe₂ system / V.V. Halyan, M.V. Shevchuk, G.Ye. Davydyuk, S.V. Voronyuk, A.H. Kevshyn, V.V. Bulatetsky // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2009. — Т. 12, № 2. — С. 138-142. — Бібліогр.: 14 назв. — англ. |
series |
Semiconductor Physics Quantum Electronics & Optoelectronics |
work_keys_str_mv |
AT halyanvv glassformationregionandxrayanalysisoftheglassyalloysinaggase2ges2aggas2gese2system AT shevchukmv glassformationregionandxrayanalysisoftheglassyalloysinaggase2ges2aggas2gese2system AT davydyukgye glassformationregionandxrayanalysisoftheglassyalloysinaggase2ges2aggas2gese2system AT voronyuksv glassformationregionandxrayanalysisoftheglassyalloysinaggase2ges2aggas2gese2system AT kevshynah glassformationregionandxrayanalysisoftheglassyalloysinaggase2ges2aggas2gese2system AT bulatetskyvv glassformationregionandxrayanalysisoftheglassyalloysinaggase2ges2aggas2gese2system |
first_indexed |
2023-10-18T20:32:52Z |
last_indexed |
2023-10-18T20:32:52Z |
_version_ |
1796150485546172416 |