Photoluminescence studies of CdTe polycrystalline films

Photoluminescence (PL) studies of CdTe polycrystalline films are reported. The films were grown using the modified close space sublimation technique on sapphire substrates. The mean grain size in the investigated films was ranged from 10 up to 360 μm. The distinct spectral bands around 1.580 and...

Повний опис

Збережено в:
Бібліографічні деталі
Дата:2012
Автори: Tetyorkin, V.V., Sukach, A.V., Stariy, S.V., Boiko, V.A.
Формат: Стаття
Мова:English
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2012
Назва видання:Semiconductor Physics Quantum Electronics & Optoelectronics
Онлайн доступ:http://dspace.nbuv.gov.ua/handle/123456789/118723
Теги: Додати тег
Немає тегів, Будьте першим, хто поставить тег для цього запису!
Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Photoluminescence studies of CdTe polycrystalline films / V.V. Tetyorkin, A.V. Sukach, S.V. Stariy and V.A. Boiko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 4. — С. 40-44. — Бібліогр.: 28 назв. — англ.

Репозитарії

Digital Library of Periodicals of National Academy of Sciences of Ukraine
id irk-123456789-118723
record_format dspace
spelling irk-123456789-1187232017-06-01T03:04:58Z Photoluminescence studies of CdTe polycrystalline films Tetyorkin, V.V. Sukach, A.V. Stariy, S.V. Boiko, V.A. Photoluminescence (PL) studies of CdTe polycrystalline films are reported. The films were grown using the modified close space sublimation technique on sapphire substrates. The mean grain size in the investigated films was ranged from 10 up to 360 μm. The distinct spectral bands around 1.580 and 1.440 eV were observed at 77 K. These bands are attributed to shallow bound excitons at dislocations and deep defects, respectively. The intensity of luminescence related to dislocation defects is found to be proportional to the density of grain boundaries. The nature of grain boundaries in the investigated films has been briefly discussed. 2012 Article Photoluminescence studies of CdTe polycrystalline films / V.V. Tetyorkin, A.V. Sukach, S.V. Stariy and V.A. Boiko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 4. — С. 40-44. — Бібліогр.: 28 назв. — англ. 1560-8034 PACS 78.55.E http://dspace.nbuv.gov.ua/handle/123456789/118723 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
language English
description Photoluminescence (PL) studies of CdTe polycrystalline films are reported. The films were grown using the modified close space sublimation technique on sapphire substrates. The mean grain size in the investigated films was ranged from 10 up to 360 μm. The distinct spectral bands around 1.580 and 1.440 eV were observed at 77 K. These bands are attributed to shallow bound excitons at dislocations and deep defects, respectively. The intensity of luminescence related to dislocation defects is found to be proportional to the density of grain boundaries. The nature of grain boundaries in the investigated films has been briefly discussed.
format Article
author Tetyorkin, V.V.
Sukach, A.V.
Stariy, S.V.
Boiko, V.A.
spellingShingle Tetyorkin, V.V.
Sukach, A.V.
Stariy, S.V.
Boiko, V.A.
Photoluminescence studies of CdTe polycrystalline films
Semiconductor Physics Quantum Electronics & Optoelectronics
author_facet Tetyorkin, V.V.
Sukach, A.V.
Stariy, S.V.
Boiko, V.A.
author_sort Tetyorkin, V.V.
title Photoluminescence studies of CdTe polycrystalline films
title_short Photoluminescence studies of CdTe polycrystalline films
title_full Photoluminescence studies of CdTe polycrystalline films
title_fullStr Photoluminescence studies of CdTe polycrystalline films
title_full_unstemmed Photoluminescence studies of CdTe polycrystalline films
title_sort photoluminescence studies of cdte polycrystalline films
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
publishDate 2012
url http://dspace.nbuv.gov.ua/handle/123456789/118723
citation_txt Photoluminescence studies of CdTe polycrystalline films / V.V. Tetyorkin, A.V. Sukach, S.V. Stariy and V.A. Boiko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 4. — С. 40-44. — Бібліогр.: 28 назв. — англ.
series Semiconductor Physics Quantum Electronics & Optoelectronics
work_keys_str_mv AT tetyorkinvv photoluminescencestudiesofcdtepolycrystallinefilms
AT sukachav photoluminescencestudiesofcdtepolycrystallinefilms
AT stariysv photoluminescencestudiesofcdtepolycrystallinefilms
AT boikova photoluminescencestudiesofcdtepolycrystallinefilms
first_indexed 2023-10-18T20:32:15Z
last_indexed 2023-10-18T20:32:15Z
_version_ 1796150464391151616