Radiation-stimulated relaxation of internal mechanical straines in homoepitaxial GaP films

The electroreflectance method based on the electrolyte technique is used for investigation of electron transitions E₀, E₀ + Δ₀ in homoepitaxial films n-GaP (111) with the electron concentration 5.7*10²³ m⁻³ before and after irradiation by ⁶⁰Co gamma quanta in the dose range 10⁵ – 10⁶ rad under the r...

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Видавець:Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Дата:2004
Автори: Gentsar, P.A., Kudryavtsev, A.A.
Формат: Стаття
Мова:English
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2004
Назва видання:Semiconductor Physics Quantum Electronics & Optoelectronics
Онлайн доступ:http://dspace.nbuv.gov.ua/handle/123456789/119117
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Цитувати:Radiation-stimulated relaxation of internal mechanical straines in homoepitaxial GaP films / P.A. Gentsar, A.A. Kudryavtsev // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2004. — Т. 7, № 3. — С. 240-242. — Бібліогр.: 7 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id irk-123456789-119117
record_format dspace
spelling irk-123456789-1191172017-06-05T03:02:32Z Radiation-stimulated relaxation of internal mechanical straines in homoepitaxial GaP films Gentsar, P.A. Kudryavtsev, A.A. The electroreflectance method based on the electrolyte technique is used for investigation of electron transitions E₀, E₀ + Δ₀ in homoepitaxial films n-GaP (111) with the electron concentration 5.7*10²³ m⁻³ before and after irradiation by ⁶⁰Co gamma quanta in the dose range 10⁵ – 10⁶ rad under the room temperature. The authors observed splitting the low-energy extremum after irradiation. The decrease in internal mechanical strains inside the films as a result of gamma irradiation was estimated via changes of the electron transition energy and collision parameter of widening. Also estimated is the time of charge carrier energy relaxation after irradiation. 2004 Article Radiation-stimulated relaxation of internal mechanical straines in homoepitaxial GaP films / P.A. Gentsar, A.A. Kudryavtsev // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2004. — Т. 7, № 3. — С. 240-242. — Бібліогр.: 7 назв. — англ. 1560-8034 PACS: 73.20; 78.66 http://dspace.nbuv.gov.ua/handle/123456789/119117 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
language English
description The electroreflectance method based on the electrolyte technique is used for investigation of electron transitions E₀, E₀ + Δ₀ in homoepitaxial films n-GaP (111) with the electron concentration 5.7*10²³ m⁻³ before and after irradiation by ⁶⁰Co gamma quanta in the dose range 10⁵ – 10⁶ rad under the room temperature. The authors observed splitting the low-energy extremum after irradiation. The decrease in internal mechanical strains inside the films as a result of gamma irradiation was estimated via changes of the electron transition energy and collision parameter of widening. Also estimated is the time of charge carrier energy relaxation after irradiation.
format Article
author Gentsar, P.A.
Kudryavtsev, A.A.
spellingShingle Gentsar, P.A.
Kudryavtsev, A.A.
Radiation-stimulated relaxation of internal mechanical straines in homoepitaxial GaP films
Semiconductor Physics Quantum Electronics & Optoelectronics
author_facet Gentsar, P.A.
Kudryavtsev, A.A.
author_sort Gentsar, P.A.
title Radiation-stimulated relaxation of internal mechanical straines in homoepitaxial GaP films
title_short Radiation-stimulated relaxation of internal mechanical straines in homoepitaxial GaP films
title_full Radiation-stimulated relaxation of internal mechanical straines in homoepitaxial GaP films
title_fullStr Radiation-stimulated relaxation of internal mechanical straines in homoepitaxial GaP films
title_full_unstemmed Radiation-stimulated relaxation of internal mechanical straines in homoepitaxial GaP films
title_sort radiation-stimulated relaxation of internal mechanical straines in homoepitaxial gap films
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
publishDate 2004
url http://dspace.nbuv.gov.ua/handle/123456789/119117
citation_txt Radiation-stimulated relaxation of internal mechanical straines in homoepitaxial GaP films / P.A. Gentsar, A.A. Kudryavtsev // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2004. — Т. 7, № 3. — С. 240-242. — Бібліогр.: 7 назв. — англ.
series Semiconductor Physics Quantum Electronics & Optoelectronics
work_keys_str_mv AT gentsarpa radiationstimulatedrelaxationofinternalmechanicalstrainesinhomoepitaxialgapfilms
AT kudryavtsevaa radiationstimulatedrelaxationofinternalmechanicalstrainesinhomoepitaxialgapfilms
first_indexed 2023-10-18T20:33:44Z
last_indexed 2023-10-18T20:33:44Z
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