Laser scanning microscopy of HTS films and devices (Review Article)
The work describes the capabilities of laser scanning microscopy (LSM) as a spatially-resolved method of testing high–Tc materials and devices. The earlier results obtained by the authors are briefly reviewed. Some novel applications of the LSM are illustrated, including imaging the HTS responses...
Збережено в:
| Дата: | 2006 |
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| Автори: | , , , , , , , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
2006
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| Назва видання: | Физика низких температур |
| Теми: | |
| Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/120206 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Laser scanning microscopy of HTS films and devices (Review Article) / A.P. Zhuravel, A.G. Sivakov, O.G. Turutanov, A.N. Omelyanchouk, S.M. Anlage, A. Lukashenko, A.V. Ustinov, D. Abraimov // Физика низких температур. — 2006. — Т. 32, № 6. — С. 775–794. — Бібліогр.: 74 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| Резюме: | The work describes the capabilities of laser scanning microscopy (LSM) as a spatially-resolved
method of testing high–Tc materials and devices. The earlier results obtained by the authors are
briefly reviewed. Some novel applications of the LSM are illustrated, including imaging the HTS
responses in rf mode, probing the superconducting properties of HTS single crystals, development
of two-beam laser scanning microscopy. The existence of the phase slip lines mechanism of
resistivity in HTS materials is proven by LSM imaging. |
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