Laser scanning microscopy of HTS films and devices (Review Article)
The work describes the capabilities of laser scanning microscopy (LSM) as a spatially-resolved method of testing high–Tc materials and devices. The earlier results obtained by the authors are briefly reviewed. Some novel applications of the LSM are illustrated, including imaging the HTS responses...
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| Дата: | 2006 |
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| Автори: | , , , , , , , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
2006
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| Назва видання: | Физика низких температур |
| Теми: | |
| Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/120206 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Laser scanning microscopy of HTS films and devices (Review Article) / A.P. Zhuravel, A.G. Sivakov, O.G. Turutanov, A.N. Omelyanchouk, S.M. Anlage, A. Lukashenko, A.V. Ustinov, D. Abraimov // Физика низких температур. — 2006. — Т. 32, № 6. — С. 775–794. — Бібліогр.: 74 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| id |
irk-123456789-120206 |
|---|---|
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dspace |
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irk-123456789-1202062017-06-12T03:05:31Z Laser scanning microscopy of HTS films and devices (Review Article) Zhuravel, A.P. Sivakov, A.G. Turutanov, O.G. Omelyanchouk, A.N. Anlage, S.M. Lukashenko, A. Ustinov, A.V. Abraimov, D. Experimental Methods and Applications The work describes the capabilities of laser scanning microscopy (LSM) as a spatially-resolved method of testing high–Tc materials and devices. The earlier results obtained by the authors are briefly reviewed. Some novel applications of the LSM are illustrated, including imaging the HTS responses in rf mode, probing the superconducting properties of HTS single crystals, development of two-beam laser scanning microscopy. The existence of the phase slip lines mechanism of resistivity in HTS materials is proven by LSM imaging. 2006 Article Laser scanning microscopy of HTS films and devices (Review Article) / A.P. Zhuravel, A.G. Sivakov, O.G. Turutanov, A.N. Omelyanchouk, S.M. Anlage, A. Lukashenko, A.V. Ustinov, D. Abraimov // Физика низких температур. — 2006. — Т. 32, № 6. — С. 775–794. — Бібліогр.: 74 назв. — англ. 0132-6414 PACS: 68.37.–d, 74.25.Nf, 74.78.Bz, 85.25.–j http://dspace.nbuv.gov.ua/handle/123456789/120206 en Физика низких температур Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| language |
English |
| topic |
Experimental Methods and Applications Experimental Methods and Applications |
| spellingShingle |
Experimental Methods and Applications Experimental Methods and Applications Zhuravel, A.P. Sivakov, A.G. Turutanov, O.G. Omelyanchouk, A.N. Anlage, S.M. Lukashenko, A. Ustinov, A.V. Abraimov, D. Laser scanning microscopy of HTS films and devices (Review Article) Физика низких температур |
| description |
The work describes the capabilities of laser scanning microscopy (LSM) as a spatially-resolved
method of testing high–Tc materials and devices. The earlier results obtained by the authors are
briefly reviewed. Some novel applications of the LSM are illustrated, including imaging the HTS
responses in rf mode, probing the superconducting properties of HTS single crystals, development
of two-beam laser scanning microscopy. The existence of the phase slip lines mechanism of
resistivity in HTS materials is proven by LSM imaging. |
| format |
Article |
| author |
Zhuravel, A.P. Sivakov, A.G. Turutanov, O.G. Omelyanchouk, A.N. Anlage, S.M. Lukashenko, A. Ustinov, A.V. Abraimov, D. |
| author_facet |
Zhuravel, A.P. Sivakov, A.G. Turutanov, O.G. Omelyanchouk, A.N. Anlage, S.M. Lukashenko, A. Ustinov, A.V. Abraimov, D. |
| author_sort |
Zhuravel, A.P. |
| title |
Laser scanning microscopy of HTS films and devices (Review Article) |
| title_short |
Laser scanning microscopy of HTS films and devices (Review Article) |
| title_full |
Laser scanning microscopy of HTS films and devices (Review Article) |
| title_fullStr |
Laser scanning microscopy of HTS films and devices (Review Article) |
| title_full_unstemmed |
Laser scanning microscopy of HTS films and devices (Review Article) |
| title_sort |
laser scanning microscopy of hts films and devices (review article) |
| publisher |
Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України |
| publishDate |
2006 |
| topic_facet |
Experimental Methods and Applications |
| url |
http://dspace.nbuv.gov.ua/handle/123456789/120206 |
| citation_txt |
Laser scanning microscopy of HTS films and devices
(Review Article) / A.P. Zhuravel, A.G. Sivakov, O.G. Turutanov, A.N. Omelyanchouk, S.M. Anlage, A. Lukashenko, A.V. Ustinov, D. Abraimov // Физика низких температур. — 2006. — Т. 32, № 6. — С. 775–794. — Бібліогр.: 74 назв. — англ. |
| series |
Физика низких температур |
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| first_indexed |
2023-10-18T20:36:31Z |
| last_indexed |
2023-10-18T20:36:31Z |
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