Microwave properties of HTS films: measurements in millimeter wave range
A theoretical and experimental justification of an approach proposed and developed by us for surface impedance standard measurements of HTS films is presented. An analysis of the electromagnetic properties of quasi-optical dielectric resonators with conducting endplates, which provides a theoreti...
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| Дата: | 2006 |
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| Автори: | , , , , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
2006
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| Назва видання: | Физика низких температур |
| Теми: | |
| Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/120207 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Microwave properties of HTS films: measurements in millimeter wave range / N.T. Cherpak, A.A. Barannik, Yu.V. Prokopenko, Yu.F. Filipov, S.A. Vitusevich // Физика низких температур. — 2006. — Т. 32, № 6. — С. 795–801. — Бібліогр.: 21 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| id |
irk-123456789-120207 |
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dspace |
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irk-123456789-1202072017-06-12T03:04:46Z Microwave properties of HTS films: measurements in millimeter wave range Cherpak, N.T. Barannik, A.A. Prokopenko, Yu.V. Filipov, Yu.F. Vitusevich, S.A. Experimental Methods and Applications A theoretical and experimental justification of an approach proposed and developed by us for surface impedance standard measurements of HTS films is presented. An analysis of the electromagnetic properties of quasi-optical dielectric resonators with conducting endplates, which provides a theoretical background for studies of HTS films in the millimeter wave range, is performed. With this technique, the highest quality modes, namely whispering gallery modes, are excited in a dielectric cylindrical disc sandwiched between HTS films. Considerable enhancement of the sensitivity of surface resistance measurements in the millimeter wave range is demonstrated, which is important for the fundamental investigation of superconductor physics. It is also shown that the measured frequency shift in the resonator with the HTS endplates as a function of the temperature reveals a possibility for accurate evaluation of the field penetration depth in HTS films. 2006 Article Microwave properties of HTS films: measurements in millimeter wave range / N.T. Cherpak, A.A. Barannik, Yu.V. Prokopenko, Yu.F. Filipov, S.A. Vitusevich // Физика низких температур. — 2006. — Т. 32, № 6. — С. 795–801. — Бібліогр.: 21 назв. — англ. 0132-6414 PACS: 74.25.Nf, 74.78.Bz, 84.40.Dc, 07.57.–c http://dspace.nbuv.gov.ua/handle/123456789/120207 en Физика низких температур Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| language |
English |
| topic |
Experimental Methods and Applications Experimental Methods and Applications |
| spellingShingle |
Experimental Methods and Applications Experimental Methods and Applications Cherpak, N.T. Barannik, A.A. Prokopenko, Yu.V. Filipov, Yu.F. Vitusevich, S.A. Microwave properties of HTS films: measurements in millimeter wave range Физика низких температур |
| description |
A theoretical and experimental justification of an approach proposed and developed by us for
surface impedance standard measurements of HTS films is presented. An analysis of the electromagnetic
properties of quasi-optical dielectric resonators with conducting endplates, which provides
a theoretical background for studies of HTS films in the millimeter wave range, is performed.
With this technique, the highest quality modes, namely whispering gallery modes, are excited in a
dielectric cylindrical disc sandwiched between HTS films. Considerable enhancement of the sensitivity
of surface resistance measurements in the millimeter wave range is demonstrated, which is
important for the fundamental investigation of superconductor physics. It is also shown that the
measured frequency shift in the resonator with the HTS endplates as a function of the temperature
reveals a possibility for accurate evaluation of the field penetration depth in HTS films. |
| format |
Article |
| author |
Cherpak, N.T. Barannik, A.A. Prokopenko, Yu.V. Filipov, Yu.F. Vitusevich, S.A. |
| author_facet |
Cherpak, N.T. Barannik, A.A. Prokopenko, Yu.V. Filipov, Yu.F. Vitusevich, S.A. |
| author_sort |
Cherpak, N.T. |
| title |
Microwave properties of HTS films: measurements in millimeter wave range |
| title_short |
Microwave properties of HTS films: measurements in millimeter wave range |
| title_full |
Microwave properties of HTS films: measurements in millimeter wave range |
| title_fullStr |
Microwave properties of HTS films: measurements in millimeter wave range |
| title_full_unstemmed |
Microwave properties of HTS films: measurements in millimeter wave range |
| title_sort |
microwave properties of hts films: measurements in millimeter wave range |
| publisher |
Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України |
| publishDate |
2006 |
| topic_facet |
Experimental Methods and Applications |
| url |
http://dspace.nbuv.gov.ua/handle/123456789/120207 |
| citation_txt |
Microwave properties of HTS films: measurements
in millimeter wave range / N.T. Cherpak, A.A. Barannik, Yu.V. Prokopenko, Yu.F. Filipov, S.A. Vitusevich // Физика низких температур. — 2006. — Т. 32, № 6. — С. 795–801. — Бібліогр.: 21 назв. — англ. |
| series |
Физика низких температур |
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| first_indexed |
2023-10-18T20:36:31Z |
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2023-10-18T20:36:31Z |
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