Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method

Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method

The methods of three-crystal X-ray diffractometry were used for investigating structure perfection in surface-adjacent damaged layer (DL) formed in the process of mechanical and chemical-mechanical treatment of sapphire crystals with the surface orientation {0001} {11-20}. Analysis of the diffractio...

Повний опис

Збережено в:
Бібліографічні деталі
Дата:2014
Автори: Tkachenko, V.F., Kryvonogov, S.I., Budnikov, A.T., Lukienko, O.A., Vovk, E.A.
Формат: Стаття
Мова:English
Опубліковано: НТК «Інститут монокристалів» НАН України 2014
Назва видання:Functional Materials
Теми:
Characterization and properties
Онлайн доступ:http://dspace.nbuv.gov.ua/handle/123456789/120413
Теги: Додати тег
Немає тегів, Будьте першим, хто поставить тег для цього запису!
Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method / V.F. Tkachenko, S.I. Kryvonogov, A.T. Budnikov, O.A. Lukienko, E.A. Vovk // Functional Materials. — 2014. — Т. 21, № 2. — С. 171-175. — Бібліогр.: 17 назв. — англ.

Репозитарії

Digital Library of Periodicals of National Academy of Sciences of Ukraine
id irk-123456789-120413
record_format dspace
spelling irk-123456789-1204132017-06-13T03:02:29Z Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method Tkachenko, V.F. Kryvonogov, S.I. Budnikov, A.T. Lukienko, O.A. Vovk, E.A. Characterization and properties The methods of three-crystal X-ray diffractometry were used for investigating structure perfection in surface-adjacent damaged layer (DL) formed in the process of mechanical and chemical-mechanical treatment of sapphire crystals with the surface orientation {0001} {11-20}. Analysis of the diffraction reflection curves made it possible to establish the structure and character of distortions in the DL. There was established the mean-square disorientation between the fragments, which allowed to characterize the defects structure of the surface-adjacent DL. 2014 Article Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method / V.F. Tkachenko, S.I. Kryvonogov, A.T. Budnikov, O.A. Lukienko, E.A. Vovk // Functional Materials. — 2014. — Т. 21, № 2. — С. 171-175. — Бібліогр.: 17 назв. — англ. 1027-5495 DOI: dx.doi.org/10.15407/fm21.02.171 http://dspace.nbuv.gov.ua/handle/123456789/120413 en Functional Materials НТК «Інститут монокристалів» НАН України
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
language English
topic Characterization and properties
Characterization and properties
spellingShingle Characterization and properties
Characterization and properties
Tkachenko, V.F.
Kryvonogov, S.I.
Budnikov, A.T.
Lukienko, O.A.
Vovk, E.A.
Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method
Functional Materials
description The methods of three-crystal X-ray diffractometry were used for investigating structure perfection in surface-adjacent damaged layer (DL) formed in the process of mechanical and chemical-mechanical treatment of sapphire crystals with the surface orientation {0001} {11-20}. Analysis of the diffraction reflection curves made it possible to establish the structure and character of distortions in the DL. There was established the mean-square disorientation between the fragments, which allowed to characterize the defects structure of the surface-adjacent DL.
format Article
author Tkachenko, V.F.
Kryvonogov, S.I.
Budnikov, A.T.
Lukienko, O.A.
Vovk, E.A.
author_facet Tkachenko, V.F.
Kryvonogov, S.I.
Budnikov, A.T.
Lukienko, O.A.
Vovk, E.A.
author_sort Tkachenko, V.F.
title Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method
title_short Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method
title_full Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method
title_fullStr Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method
title_full_unstemmed Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method
title_sort investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal x-ray diffraction method
publisher НТК «Інститут монокристалів» НАН України
publishDate 2014
topic_facet Characterization and properties
url http://dspace.nbuv.gov.ua/handle/123456789/120413
citation_txt Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method / V.F. Tkachenko, S.I. Kryvonogov, A.T. Budnikov, O.A. Lukienko, E.A. Vovk // Functional Materials. — 2014. — Т. 21, № 2. — С. 171-175. — Бібліогр.: 17 назв. — англ.
series Functional Materials
work_keys_str_mv AT tkachenkovf investigationofdamagedlayerformedatmechanicaltreatmentofsapphireusingthreecrystalxraydiffractionmethod
AT kryvonogovsi investigationofdamagedlayerformedatmechanicaltreatmentofsapphireusingthreecrystalxraydiffractionmethod
AT budnikovat investigationofdamagedlayerformedatmechanicaltreatmentofsapphireusingthreecrystalxraydiffractionmethod
AT lukienkooa investigationofdamagedlayerformedatmechanicaltreatmentofsapphireusingthreecrystalxraydiffractionmethod
AT vovkea investigationofdamagedlayerformedatmechanicaltreatmentofsapphireusingthreecrystalxraydiffractionmethod
first_indexed 2023-10-18T20:37:00Z
last_indexed 2023-10-18T20:37:00Z
_version_ 1796150664829599744

Схожі ресурси