Changes in electrophysical properties of heavily doped n-Ge <As> single crystals under the influence of thermoannealings

Features of changes in the electrophysical parameters (concentrations of charge carriers ne and their mobilities μ ) in heavily doped n-Ge <As> single crystals, which occur as a result of the series of thermoannealings (each for 0.5 h) over a wide temperature range (540 ≤T≤ 900 °C), have been...

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Бібліографічні деталі
Дата:2015
Автор: Gaidar, G.P.
Формат: Стаття
Мова:English
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2015
Назва видання:Semiconductor Physics Quantum Electronics & Optoelectronics
Онлайн доступ:http://dspace.nbuv.gov.ua/handle/123456789/120727
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Changes in electrophysical properties of heavily doped n-Ge <As> single crystals under the influence of thermoannealings / G.P. Gaidar // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2015. — Т. 18, № 1. — С. 53-56. — Бібліогр.: 13 назв. — англ.

Репозитарії

Digital Library of Periodicals of National Academy of Sciences of Ukraine
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spelling irk-123456789-1207272017-06-13T03:04:56Z Changes in electrophysical properties of heavily doped n-Ge <As> single crystals under the influence of thermoannealings Gaidar, G.P. Features of changes in the electrophysical parameters (concentrations of charge carriers ne and their mobilities μ ) in heavily doped n-Ge <As> single crystals, which occur as a result of the series of thermoannealings (each for 0.5 h) over a wide temperature range (540 ≤T≤ 900 °C), have been investigated and explained. 2015 Article Changes in electrophysical properties of heavily doped n-Ge <As> single crystals under the influence of thermoannealings / G.P. Gaidar // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2015. — Т. 18, № 1. — С. 53-56. — Бібліогр.: 13 назв. — англ. 1560-8034 PACS 61.82.Fk http://dspace.nbuv.gov.ua/handle/123456789/120727 DOI: 10.15407/spqeo18.01.053 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
language English
description Features of changes in the electrophysical parameters (concentrations of charge carriers ne and their mobilities μ ) in heavily doped n-Ge <As> single crystals, which occur as a result of the series of thermoannealings (each for 0.5 h) over a wide temperature range (540 ≤T≤ 900 °C), have been investigated and explained.
format Article
author Gaidar, G.P.
spellingShingle Gaidar, G.P.
Changes in electrophysical properties of heavily doped n-Ge <As> single crystals under the influence of thermoannealings
Semiconductor Physics Quantum Electronics & Optoelectronics
author_facet Gaidar, G.P.
author_sort Gaidar, G.P.
title Changes in electrophysical properties of heavily doped n-Ge <As> single crystals under the influence of thermoannealings
title_short Changes in electrophysical properties of heavily doped n-Ge <As> single crystals under the influence of thermoannealings
title_full Changes in electrophysical properties of heavily doped n-Ge <As> single crystals under the influence of thermoannealings
title_fullStr Changes in electrophysical properties of heavily doped n-Ge <As> single crystals under the influence of thermoannealings
title_full_unstemmed Changes in electrophysical properties of heavily doped n-Ge <As> single crystals under the influence of thermoannealings
title_sort changes in electrophysical properties of heavily doped n-ge <as> single crystals under the influence of thermoannealings
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
publishDate 2015
url http://dspace.nbuv.gov.ua/handle/123456789/120727
citation_txt Changes in electrophysical properties of heavily doped n-Ge <As> single crystals under the influence of thermoannealings / G.P. Gaidar // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2015. — Т. 18, № 1. — С. 53-56. — Бібліогр.: 13 назв. — англ.
series Semiconductor Physics Quantum Electronics & Optoelectronics
work_keys_str_mv AT gaidargp changesinelectrophysicalpropertiesofheavilydopedngeassinglecrystalsundertheinfluenceofthermoannealings
first_indexed 2023-10-18T20:37:44Z
last_indexed 2023-10-18T20:37:44Z
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