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Probabilistic approach to the analysis of regularities in behavior of material parameters of electronic equipment under action of external fields

Probabilistic approach to the analysis of regularities in behavior of material parameters of electronic equipment under action of external fields

It has been shown that the dependence between the parameters of materials of electronic equipment and external fields is determined by the distribution function of the corresponding random variable. The obtained results have been applied to the analysis of a number of physical phenomena.

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Bibliographic Details
Main Author: Milenin, G.V.
Format: Article
Language:English
Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2015
Series:Semiconductor Physics Quantum Electronics & Optoelectronics
Online Access:http://dspace.nbuv.gov.ua/handle/123456789/121275
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spelling irk-123456789-1212752017-06-14T03:07:03Z Probabilistic approach to the analysis of regularities in behavior of material parameters of electronic equipment under action of external fields Milenin, G.V. It has been shown that the dependence between the parameters of materials of electronic equipment and external fields is determined by the distribution function of the corresponding random variable. The obtained results have been applied to the analysis of a number of physical phenomena. 2015 Article Probabilistic approach to the analysis of regularities in behavior of material parameters of electronic equipment under action of external fields / G.V. Milenin // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2015. — Т. 18, № 4. — С. 456-459. — Бібліогр.: 10 назв. — англ. 1560-8034 DOI: 10.15407/spqeo18.04.456 PACS 61.72.-y, 75.78.-n http://dspace.nbuv.gov.ua/handle/123456789/121275 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
language English
description It has been shown that the dependence between the parameters of materials of electronic equipment and external fields is determined by the distribution function of the corresponding random variable. The obtained results have been applied to the analysis of a number of physical phenomena.
format Article
author Milenin, G.V.
spellingShingle Milenin, G.V.
Probabilistic approach to the analysis of regularities in behavior of material parameters of electronic equipment under action of external fields
Semiconductor Physics Quantum Electronics & Optoelectronics
author_facet Milenin, G.V.
author_sort Milenin, G.V.
title Probabilistic approach to the analysis of regularities in behavior of material parameters of electronic equipment under action of external fields
title_short Probabilistic approach to the analysis of regularities in behavior of material parameters of electronic equipment under action of external fields
title_full Probabilistic approach to the analysis of regularities in behavior of material parameters of electronic equipment under action of external fields
title_fullStr Probabilistic approach to the analysis of regularities in behavior of material parameters of electronic equipment under action of external fields
title_full_unstemmed Probabilistic approach to the analysis of regularities in behavior of material parameters of electronic equipment under action of external fields
title_sort probabilistic approach to the analysis of regularities in behavior of material parameters of electronic equipment under action of external fields
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
publishDate 2015
url http://dspace.nbuv.gov.ua/handle/123456789/121275
citation_txt Probabilistic approach to the analysis of regularities in behavior of material parameters of electronic equipment under action of external fields / G.V. Milenin // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2015. — Т. 18, № 4. — С. 456-459. — Бібліогр.: 10 назв. — англ.
series Semiconductor Physics Quantum Electronics & Optoelectronics
work_keys_str_mv AT mileningv probabilisticapproachtotheanalysisofregularitiesinbehaviorofmaterialparametersofelectronicequipmentunderactionofexternalfields
first_indexed 2023-10-18T20:39:03Z
last_indexed 2023-10-18T20:39:03Z
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