Precise measurements of the wavelength in KrCl laser spectral region (222 nm)

The technique for precise measurements of wavelengths in the range around 222 nm (45030 cm⁻¹) has been presented. The reciprocal linear dispersion of the spectrometer was 0.529 Å/mm. The measurements were made in the second spectral order for a grating with 2400 lines/mm. Identification of emission...

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Бібліографічні деталі
Дата:2016
Автори: Zubrilin, N.G., Pavlov, I.A., Baschenko, S.M., Tkachenko, O.M.
Формат: Стаття
Мова:English
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2016
Назва видання:Semiconductor Physics Quantum Electronics & Optoelectronics
Онлайн доступ:http://dspace.nbuv.gov.ua/handle/123456789/121561
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Precise measurements of the wavelength in KrCl laser spectral region (222 nm) / N.G. Zubrilin, I.A. Pavlov, S.M. Baschenko, O.M. Tkachenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2016. — Т. 19, № 2. — С. 188-191. — Бібліогр.: 7 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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spelling irk-123456789-1215612017-06-15T03:04:43Z Precise measurements of the wavelength in KrCl laser spectral region (222 nm) Zubrilin, N.G. Pavlov, I.A. Baschenko, S.M. Tkachenko, O.M. The technique for precise measurements of wavelengths in the range around 222 nm (45030 cm⁻¹) has been presented. The reciprocal linear dispersion of the spectrometer was 0.529 Å/mm. The measurements were made in the second spectral order for a grating with 2400 lines/mm. Identification of emission lines of hollow cathode lamp (Fe) was made in the spectral range 4428…4452 Å. The wavelengths were measured for 32 identified lines in the spectrum. The mean square error of easurements is ∼0.0005 Å. 2016 Article Precise measurements of the wavelength in KrCl laser spectral region (222 nm) / N.G. Zubrilin, I.A. Pavlov, S.M. Baschenko, O.M. Tkachenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2016. — Т. 19, № 2. — С. 188-191. — Бібліогр.: 7 назв. — англ. 1560-8034 DOI: 10.15407/spqeo19.02.188 PACS 42.60.Jf, 42.62.Fi http://dspace.nbuv.gov.ua/handle/123456789/121561 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
language English
description The technique for precise measurements of wavelengths in the range around 222 nm (45030 cm⁻¹) has been presented. The reciprocal linear dispersion of the spectrometer was 0.529 Å/mm. The measurements were made in the second spectral order for a grating with 2400 lines/mm. Identification of emission lines of hollow cathode lamp (Fe) was made in the spectral range 4428…4452 Å. The wavelengths were measured for 32 identified lines in the spectrum. The mean square error of easurements is ∼0.0005 Å.
format Article
author Zubrilin, N.G.
Pavlov, I.A.
Baschenko, S.M.
Tkachenko, O.M.
spellingShingle Zubrilin, N.G.
Pavlov, I.A.
Baschenko, S.M.
Tkachenko, O.M.
Precise measurements of the wavelength in KrCl laser spectral region (222 nm)
Semiconductor Physics Quantum Electronics & Optoelectronics
author_facet Zubrilin, N.G.
Pavlov, I.A.
Baschenko, S.M.
Tkachenko, O.M.
author_sort Zubrilin, N.G.
title Precise measurements of the wavelength in KrCl laser spectral region (222 nm)
title_short Precise measurements of the wavelength in KrCl laser spectral region (222 nm)
title_full Precise measurements of the wavelength in KrCl laser spectral region (222 nm)
title_fullStr Precise measurements of the wavelength in KrCl laser spectral region (222 nm)
title_full_unstemmed Precise measurements of the wavelength in KrCl laser spectral region (222 nm)
title_sort precise measurements of the wavelength in krcl laser spectral region (222 nm)
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
publishDate 2016
url http://dspace.nbuv.gov.ua/handle/123456789/121561
citation_txt Precise measurements of the wavelength in KrCl laser spectral region (222 nm) / N.G. Zubrilin, I.A. Pavlov, S.M. Baschenko, O.M. Tkachenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2016. — Т. 19, № 2. — С. 188-191. — Бібліогр.: 7 назв. — англ.
series Semiconductor Physics Quantum Electronics & Optoelectronics
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first_indexed 2023-10-18T20:39:49Z
last_indexed 2023-10-18T20:39:49Z
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