On the nature of ionic liquid gating of Nd₂CuO₄ thin films

Recently, ionic liquid gating has been used to modulate the charge carrier properties of metal oxides. The mechanism behind it, however, is still a matter of debate. In this paper, we report experiments on doped and undoped Nd₂CuO₄. We find major resistance drops of the bilayer coupled to observatio...

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Видавець:Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
Дата:2017
Автори: Atesci, Hasan, Coneri, Francesco, Leeuwenhoek, Maarten, Hilgenkamp, Hans, Jan M. van Ruitenbeek
Формат: Стаття
Мова:English
Опубліковано: Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України 2017
Назва видання:Физика низких температур
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Онлайн доступ:http://dspace.nbuv.gov.ua/handle/123456789/129380
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Цитувати:On the nature of ionic liquid gating of Nd₂CuO₄ thin films / Hasan Atesci, Francesco Coneri, Maarten Leeuwenhoek, Hans Hilgenkamp, Jan M. van Ruitenbeek // Физика низких температур. — 2017. — Т. 43, № 2. — С. 353-359. — Бібліогр.: 50 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id irk-123456789-129380
record_format dspace
spelling irk-123456789-1293802018-01-20T03:05:30Z On the nature of ionic liquid gating of Nd₂CuO₄ thin films Atesci, Hasan Coneri, Francesco Leeuwenhoek, Maarten Hilgenkamp, Hans Jan M. van Ruitenbeek К 100-летию со дня рождения И.М. Лифшица Recently, ionic liquid gating has been used to modulate the charge carrier properties of metal oxides. The mechanism behind it, however, is still a matter of debate. In this paper, we report experiments on doped and undoped Nd₂CuO₄. We find major resistance drops of the bilayer coupled to observations of the presence of a considerable Faradeic component in the gate current and of the appearance of charge transfer peaks in the cyclic voltammetry data. This leads us to propose a mechanism of gating based on irreversible electrochemical reactions, likely due to trace amounts of contaminations present in the ionic liquid. This work is therefore in line with previous reports confirming the presence of irreversible electrochemistry in ionic liquid gated electron- doped cuprates. 2017 Article On the nature of ionic liquid gating of Nd₂CuO₄ thin films / Hasan Atesci, Francesco Coneri, Maarten Leeuwenhoek, Hans Hilgenkamp, Jan M. van Ruitenbeek // Физика низких температур. — 2017. — Т. 43, № 2. — С. 353-359. — Бібліогр.: 50 назв. — англ. 0132-6414 PACS: 66.10.–x, 68.15.+e, 82.45.–h http://dspace.nbuv.gov.ua/handle/123456789/129380 en Физика низких температур Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
language English
topic К 100-летию со дня рождения И.М. Лифшица
К 100-летию со дня рождения И.М. Лифшица
spellingShingle К 100-летию со дня рождения И.М. Лифшица
К 100-летию со дня рождения И.М. Лифшица
Atesci, Hasan
Coneri, Francesco
Leeuwenhoek, Maarten
Hilgenkamp, Hans
Jan M. van Ruitenbeek
On the nature of ionic liquid gating of Nd₂CuO₄ thin films
Физика низких температур
description Recently, ionic liquid gating has been used to modulate the charge carrier properties of metal oxides. The mechanism behind it, however, is still a matter of debate. In this paper, we report experiments on doped and undoped Nd₂CuO₄. We find major resistance drops of the bilayer coupled to observations of the presence of a considerable Faradeic component in the gate current and of the appearance of charge transfer peaks in the cyclic voltammetry data. This leads us to propose a mechanism of gating based on irreversible electrochemical reactions, likely due to trace amounts of contaminations present in the ionic liquid. This work is therefore in line with previous reports confirming the presence of irreversible electrochemistry in ionic liquid gated electron- doped cuprates.
format Article
author Atesci, Hasan
Coneri, Francesco
Leeuwenhoek, Maarten
Hilgenkamp, Hans
Jan M. van Ruitenbeek
author_facet Atesci, Hasan
Coneri, Francesco
Leeuwenhoek, Maarten
Hilgenkamp, Hans
Jan M. van Ruitenbeek
author_sort Atesci, Hasan
title On the nature of ionic liquid gating of Nd₂CuO₄ thin films
title_short On the nature of ionic liquid gating of Nd₂CuO₄ thin films
title_full On the nature of ionic liquid gating of Nd₂CuO₄ thin films
title_fullStr On the nature of ionic liquid gating of Nd₂CuO₄ thin films
title_full_unstemmed On the nature of ionic liquid gating of Nd₂CuO₄ thin films
title_sort on the nature of ionic liquid gating of nd₂cuo₄ thin films
publisher Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
publishDate 2017
topic_facet К 100-летию со дня рождения И.М. Лифшица
url http://dspace.nbuv.gov.ua/handle/123456789/129380
citation_txt On the nature of ionic liquid gating of Nd₂CuO₄ thin films / Hasan Atesci, Francesco Coneri, Maarten Leeuwenhoek, Hans Hilgenkamp, Jan M. van Ruitenbeek // Физика низких температур. — 2017. — Т. 43, № 2. — С. 353-359. — Бібліогр.: 50 назв. — англ.
series Физика низких температур
work_keys_str_mv AT atescihasan onthenatureofionicliquidgatingofnd2cuo4thinfilms
AT conerifrancesco onthenatureofionicliquidgatingofnd2cuo4thinfilms
AT leeuwenhoekmaarten onthenatureofionicliquidgatingofnd2cuo4thinfilms
AT hilgenkamphans onthenatureofionicliquidgatingofnd2cuo4thinfilms
AT janmvanruitenbeek onthenatureofionicliquidgatingofnd2cuo4thinfilms
first_indexed 2023-10-18T20:57:37Z
last_indexed 2023-10-18T20:57:37Z
_version_ 1796151560915386368