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XRD studies of surface layers in sapphire substrates of <101Bar2> crystalloghaphic orientation

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Bibliographic Details
Main Authors: Tkachenko, V.F., Lukienko, O.A., Budnikov, A.T., Vovk, E.A., Krivonogov, S.I., Dan`ko, A.Ya.
Format: Article
Language:English
Published: НТК «Інститут монокристалів» НАН України 2011
Series:Functional Materials
Subjects:
Online Access:http://dspace.nbuv.gov.ua/handle/123456789/135460
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id irk-123456789-135460
record_format dspace
spelling irk-123456789-1354602018-06-16T03:03:39Z XRD studies of surface layers in sapphire substrates of <101Bar2> crystalloghaphic orientation Tkachenko, V.F. Lukienko, O.A. Budnikov, A.T. Vovk, E.A. Krivonogov, S.I. Dan`ko, A.Ya. Characterization and properties 2011 Article XRD studies of surface layers in sapphire substrates of <101Bar2> crystalloghaphic orientation / V.F. Tkachenko, O.A. Lukienko, A.T. Budnikov, E.A. Vovk, S.I. Krivonogov, A.Ya. Dan`ko // Functional Materials. — 2011. — Т. 18, № 2. — С. 171-175. — Бібліогр.: 9 назв. — англ. 1027-5495 http://dspace.nbuv.gov.ua/handle/123456789/135460 en Functional Materials НТК «Інститут монокристалів» НАН України
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
language English
topic Characterization and properties
Characterization and properties
spellingShingle Characterization and properties
Characterization and properties
Tkachenko, V.F.
Lukienko, O.A.
Budnikov, A.T.
Vovk, E.A.
Krivonogov, S.I.
Dan`ko, A.Ya.
XRD studies of surface layers in sapphire substrates of <101Bar2> crystalloghaphic orientation
Functional Materials
format Article
author Tkachenko, V.F.
Lukienko, O.A.
Budnikov, A.T.
Vovk, E.A.
Krivonogov, S.I.
Dan`ko, A.Ya.
author_facet Tkachenko, V.F.
Lukienko, O.A.
Budnikov, A.T.
Vovk, E.A.
Krivonogov, S.I.
Dan`ko, A.Ya.
author_sort Tkachenko, V.F.
title XRD studies of surface layers in sapphire substrates of <101Bar2> crystalloghaphic orientation
title_short XRD studies of surface layers in sapphire substrates of <101Bar2> crystalloghaphic orientation
title_full XRD studies of surface layers in sapphire substrates of <101Bar2> crystalloghaphic orientation
title_fullStr XRD studies of surface layers in sapphire substrates of <101Bar2> crystalloghaphic orientation
title_full_unstemmed XRD studies of surface layers in sapphire substrates of <101Bar2> crystalloghaphic orientation
title_sort xrd studies of surface layers in sapphire substrates of <101bar2> crystalloghaphic orientation
publisher НТК «Інститут монокристалів» НАН України
publishDate 2011
topic_facet Characterization and properties
url http://dspace.nbuv.gov.ua/handle/123456789/135460
citation_txt XRD studies of surface layers in sapphire substrates of <101Bar2> crystalloghaphic orientation / V.F. Tkachenko, O.A. Lukienko, A.T. Budnikov, E.A. Vovk, S.I. Krivonogov, A.Ya. Dan`ko // Functional Materials. — 2011. — Т. 18, № 2. — С. 171-175. — Бібліогр.: 9 назв. — англ.
series Functional Materials
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AT lukienkooa xrdstudiesofsurfacelayersinsapphiresubstratesof101bar2crystalloghaphicorientation
AT budnikovat xrdstudiesofsurfacelayersinsapphiresubstratesof101bar2crystalloghaphicorientation
AT vovkea xrdstudiesofsurfacelayersinsapphiresubstratesof101bar2crystalloghaphicorientation
AT krivonogovsi xrdstudiesofsurfacelayersinsapphiresubstratesof101bar2crystalloghaphicorientation
AT dankoaya xrdstudiesofsurfacelayersinsapphiresubstratesof101bar2crystalloghaphicorientation
first_indexed 2023-10-18T21:10:25Z
last_indexed 2023-10-18T21:10:25Z
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