Silicon crystal strength reduction due to magnetoresonance

• Дата: 2007
• Автори: Makara, V.A., Pogorilyi, A.M., Steblenko, L.P., Kuryliuk, A.M., Naumenko, S.M., Kobzar, Yu.L., Kravets, A.F., Podyalovsky, D.I., Matveeva, O.V.
• Формат: Стаття
• Мова: English
• Опубліковано: НТК «Інститут монокристалів» НАН України 2007
• Назва видання: Functional Materials
• Онлайн доступ: http://dspace.nbuv.gov.ua/handle/123456789/136494
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Цитувати: Silicon crystal strength reduction due to magnetoresonance / V.A. Makara, A.M. Pogorilyi, L.P. Steblenko, A.M. Kuryliuk, S.M. Naumenko, Yu.L. Kobzar, A.F. Kravets, D.I. Podyalovsky, O.V. Matveeva // Functional Materials. — 2007. — Т. 14, № 2. — С. 192-194. — Бібліогр.: 8 назв. — англ.

The magnetoresonance influence as well as the micrawave superhigh-frequency (SHF) magnetic field effect on the microhardness of silicon crystals has been studied. It is established that the action of SHF field results in decreasing microhardness, which does not relax for initial value during a long...