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Ellipsometric plasmon sensor for adsorbed layers on thin Ag and Au films
Using Kretschmann’s method, important parameters defining the propagation of surface waves (namely, the restored polarization azimuth ψ and phase difference Δ between p- and s-components of the electromagnetic wave) versus the light incidence angle θ for thin Ag and Au films have been investigated....
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Main Authors: | , , |
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Format: | Article |
Language: | English |
Published: |
НТК «Інститут монокристалів» НАН України
2005
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Series: | Functional Materials |
Online Access: | http://dspace.nbuv.gov.ua/handle/123456789/139715 |
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