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Ellipsometric plasmon sensor for adsorbed layers on thin Ag and Au films

Using Kretschmann’s method, important parameters defining the propagation of surface waves (namely, the restored polarization azimuth ψ and phase difference Δ between p- and s-components of the electromagnetic wave) versus the light incidence angle θ for thin Ag and Au films have been investigated....

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Bibliographic Details
Main Authors: Severynov, V.L., Shaikevich, I.A., Shybiko, Y.A.
Format: Article
Language:English
Published: НТК «Інститут монокристалів» НАН України 2005
Series:Functional Materials
Online Access:http://dspace.nbuv.gov.ua/handle/123456789/139715
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