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Determination of optical parameters of CdTe films by principal angle ellypsometry
The principal angle and ellipticity of the light wave reflected from the surface of the single-crystal silicon coated by a CdTe film have been measured in 366-579 nm spectral region. Using a specially developed computer graphic program of the ellipsometric data processing optical constants and a fil...
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| Main Authors: | , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
НТК «Інститут монокристалів» НАН України
2006
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| Series: | Functional Materials |
| Online Access: | http://dspace.nbuv.gov.ua/handle/123456789/139957 |
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