2025-02-23T22:29:10-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: Query fl=%2A&wt=json&json.nl=arrarr&q=id%3A%22irk-123456789-167923%22&qt=morelikethis&rows=5
2025-02-23T22:29:10-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: => GET http://localhost:8983/solr/biblio/select?fl=%2A&wt=json&json.nl=arrarr&q=id%3A%22irk-123456789-167923%22&qt=morelikethis&rows=5
2025-02-23T22:29:10-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: <= 200 OK
2025-02-23T22:29:10-05:00 DEBUG: Deserialized SOLR response
Integrated diffractometry: achieved progress and new performance capabilities
This review provides a brief overview and a discussion of dynamical integrated diffractometry and its functional capabilities. It is demonstrated that the combined use of measurements of integrated diffraction parameters on different diffraction conditions allows determining the parameters of severa...
Saved in:
Main Authors: | Lizunov, V.V., Zabolotnyy, I.M., Vasylyk, Ya.V., Golentus, I.E., Ushakov, M.V. |
---|---|
Format: | Article |
Language: | English |
Published: |
Інститут металофізики ім. Г.В. Курдюмова НАН України
2019
|
Series: | Успехи физики металлов |
Online Access: | http://dspace.nbuv.gov.ua/handle/123456789/167923 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
2025-02-23T22:29:10-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: Query fl=%2A&rows=40&rows=5&wt=json&json.nl=arrarr&q=id%3A%22irk-123456789-167923%22&qt=morelikethis
2025-02-23T22:29:10-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: => GET http://localhost:8983/solr/biblio/select?fl=%2A&rows=40&rows=5&wt=json&json.nl=arrarr&q=id%3A%22irk-123456789-167923%22&qt=morelikethis
2025-02-23T22:29:10-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: <= 200 OK
2025-02-23T22:29:10-05:00 DEBUG: Deserialized SOLR response
Similar Items
-
Integrated diffractometry: achieved progress and new performance capabilities
by: V. V. Lizunov, et al.
Published: (2019) -
New Performance Capabilities of Integral Dynamical Diffractometry of Crystal Imperfections
by: V. V. Lizunov, et al.
Published: (2015) -
Integral multiparameter diffractometry of nanosystems on the basis of effects of multiplicity of diffuse scattering
by: A. P. Shpak, et al.
Published: (2009) -
Double- and triple-crystal X-ray diffractometry of microdefects in silicon
by: Molodkin, V.B., et al.
Published: (2010) -
Double- and triple-crystal X-ray diffractometry of microdefects in silicon
by: V. B. Molodkin, et al.
Published: (2010)