⁶³Ni diffusion in C₆₀ fullerite by Mazanko, V.F., Pogorelov, A.E., Kulish, N.P., Dmitrenko, O.P., Lizunov, V.V.

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Integrated diffractometry: achieved progress and new performance capabilities by Lizunov, V.V., Zabolotnyy, I.M., Vasylyk, Ya.V., Golentus, I.E., Ushakov, M.V.

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Double- and triple-crystal X-ray diffractometry of microdefects in silicon by Molodkin, V.B., Olikhovskii, S.I., Kyslovskyy, Ye.M., Len, E.G., Reshetnyk, O.V., Vladimirova, T.P., V.V. Lizunov, V.V., Lizunova, S.V.

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Dynamical Theory of Triple-Crystal X-ray Diffractometry and Characterization of Microdefects and Strains in Imperfect Single Crystals by Molodkin, V.B., Olikhovskii, S.I., Len, E.G., Kyslovskyy, Ye.M., Reshetnyk, O.V., Vladimirova, T.P., Sheludchenko, B.V., Skakunova, E.S., Lizunov, V.V., Kochelab, E.V., Fodchuk, I.M., Klad’ko, V.P.

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Quantum-Mechanical Model of Interconsistent Amplitude and Dispersion Influences of Structure Imperfections on the Multiple Scattering Pattern for Mapping and Characterization of St... by Molodkin, V.B., Olikhovskii, S.I., Skakunova, E.S., Len, E.G., Kislovskii, E.N., Reshetnyk, O.V., Vladimirova, T.P., Lizunov, V.V., Skapa, L.N., Lizunova, S.V., Fuzik, E.V., Tolmachev, N.G., Ostafiychuk, B.K., Pylypiv, V.M., Garpul’, O.Z.

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