Behavior of the Ti-Zr-Ni thin film containing quasicrystalline and approximant phases under radiative-thermal action in transition modes

X-ray diffraction and SEM microscopy were used to study the structural and phase changes in a thin film obtained by magnetron sputtering of a Ti52Zr30Ni18 target (at.%) on a steel substrate under the radiation-thermal influence of pulsed hydrogen plasma on an QSPA Kh-50 accelerator. A technique has...

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Datum:2020
Hauptverfasser: Malykhin, S.V., Makhlai, V.A., Surovitskiy, S.V., Garkusha, I.E., Herashchenko, S.S., Kondratenko, V.V., Kopylets, I.A., Zubarev, E.N., Borisova, S.S., Fedchenko, A.V.
Format: Artikel
Sprache:English
Veröffentlicht: Національний науковий центр «Харківський фізико-технічний інститут» НАН України 2020
Schriftenreihe:Вопросы атомной науки и техники
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Online Zugang:http://dspace.nbuv.gov.ua/handle/123456789/194355
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:Behavior of the Ti-Zr-Ni thin film containing quasicrystalline and approximant phases under radiative-thermal action in transition modes / S.V. Malykhin, V.A. Makhlai, S.V. Surovitskiy, I.E. Garkusha, S.S. Herashchenko, V.V. Kondratenko, I.A. Kopylets, E.N. Zubarev, S.S. Borisova, A.V. Fedchenko // Problems of atomic science and tecnology. — 2020. — № 2. — С. 3-8. — Бібліогр.: 25 назв. — англ.

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