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Application features of the electrostatic systems for measuring the secondary electron emission yield

The analysis of the experimental systems for research of secondary electron emission during the interaction of electron beams with matter is presented. The three most common and methodologically developed variants of exper-imental systems are considered. According to their design features and method...

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Bibliographic Details
Main Authors: Karpus, S., Shliahov, I., Liashchov, M., Borisenko, V., Kochetov, S., Tsiats’ko, E., Shopen, O.
Format: Article
Language:English
Published: Національний науковий центр «Харківський фізико-технічний інститут» НАН України 2023
Series:Problems of Atomic Science and Technology
Subjects:
Online Access:http://dspace.nbuv.gov.ua/handle/123456789/196202
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