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Diffraction on a polycrystal for investigations and diagnostics of X-ray radiation of relativistic particles in a forward direction
It is shown that the diffraction on a polycrystal can be used for investigation and diagnostics of X-ray radiation emitted in a forward direction by relativistic charged particles moving in crystalline or other targets or fields. Methods for measuring radiation spectral density, divergence, and lin...
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| Format: | Article |
| Language: | English |
| Published: |
Національний науковий центр «Харківський фізико-технічний інститут» НАН України
2004
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| Series: | Вопросы атомной науки и техники |
| Subjects: | |
| Online Access: | http://dspace.nbuv.gov.ua/handle/123456789/80444 |
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| Summary: | It is shown that the diffraction on a polycrystal can be used for investigation and diagnostics of X-ray radiation
emitted in a forward direction by relativistic charged particles moving in crystalline or other targets or fields. Methods for measuring radiation spectral density, divergence, and linear polarization at any requisite energy from a few
units to tens of keV are proposed. The explanation for the origination of experimentally observed and earlier unidentified spectral peaks as a result of Bragg diffraction on a polycrystal is proposed. The experiment for verification of
the explanation is suggested. |
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