Correlation between time-resolved and integral mesurements of the soft X-ray emission in a plasma focus operated in argon

The results of experiments received on the plasma focus (PF) device with energy stored equal 1.5-5 kJ are represented in this paper. Discharge integral photos were obtained with the help of the soft x-ray pinhole camera with four 250 μm apertures. Simultaneously the short X-ray pulse recording syste...

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Bibliographic Details
Date:2008
Main Authors: Eliseev, S.P., Nikulin, V.Ya., Silin, P.V.
Format: Article
Language:English
Published: Національний науковий центр «Харківський фізико-технічний інститут» НАН України 2008
Series:Вопросы атомной науки и техники
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Online Access:https://nasplib.isofts.kiev.ua/handle/123456789/111028
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:Correlation between time-resolved and integral mesurements of the soft X-ray emission in a plasma focus operated in argon / S.P. Eliseev, V.Ya. Nikulin, P.V. Silin // Вопросы атомной науки и техники. — 2008. — № 6. — С. 216-218. — Бібліогр.: 7 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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Summary:The results of experiments received on the plasma focus (PF) device with energy stored equal 1.5-5 kJ are represented in this paper. Discharge integral photos were obtained with the help of the soft x-ray pinhole camera with four 250 μm apertures. Simultaneously the short X-ray pulse recording system was fulfilled by the fast semiconductor detectors SPPD11-04 hided 50 μm Be filters with exposure time about 1.5 ns. The soft X-ray measurements were fulfilled in the voltage range U=8-14 kV and argon pressure 1.3-3.2 Torr. Under some conditions transition from hot spots regime to column type was observed by the 50 μm pinhole camera. With help of the 20 μm pinhole camera was estimated size of the hot spots about 13-25 μm radiated quanta with energy ≥ 1.8 keV.