Correlation between time-resolved and integral mesurements of the soft X-ray emission in a plasma focus operated in argon

The results of experiments received on the plasma focus (PF) device with energy stored equal 1.5-5 kJ are represented in this paper. Discharge integral photos were obtained with the help of the soft x-ray pinhole camera with four 250 μm apertures. Simultaneously the short X-ray pulse recording syste...

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Datum:2008
Hauptverfasser: Eliseev, S.P., Nikulin, V.Ya., Silin, P.V.
Format: Artikel
Sprache:English
Veröffentlicht: Національний науковий центр «Харківський фізико-технічний інститут» НАН України 2008
Schriftenreihe:Вопросы атомной науки и техники
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Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/111028
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:Correlation between time-resolved and integral mesurements of the soft X-ray emission in a plasma focus operated in argon / S.P. Eliseev, V.Ya. Nikulin, P.V. Silin // Вопросы атомной науки и техники. — 2008. — № 6. — С. 216-218. — Бібліогр.: 7 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
Beschreibung
Zusammenfassung:The results of experiments received on the plasma focus (PF) device with energy stored equal 1.5-5 kJ are represented in this paper. Discharge integral photos were obtained with the help of the soft x-ray pinhole camera with four 250 μm apertures. Simultaneously the short X-ray pulse recording system was fulfilled by the fast semiconductor detectors SPPD11-04 hided 50 μm Be filters with exposure time about 1.5 ns. The soft X-ray measurements were fulfilled in the voltage range U=8-14 kV and argon pressure 1.3-3.2 Torr. Under some conditions transition from hot spots regime to column type was observed by the 50 μm pinhole camera. With help of the 20 μm pinhole camera was estimated size of the hot spots about 13-25 μm radiated quanta with energy ≥ 1.8 keV.