Dynamical Theory of Triple-Crystal X-ray Diffractometry and Characterization of Microdefects and Strains in Imperfect Single Crystals
A short review of basic principles and limitations in obtaining the analytical expressions for the coherent and diffuse scattering intensities measured by the triple-crystal diffractometer (TCD) are presented. Explicit analytical expressions are given for both the diffuse components of TCD profiles...
Saved in:
| Published in: | Металлофизика и новейшие технологии |
|---|---|
| Date: | 2016 |
| Main Authors: | Molodkin, V.B., Olikhovskii, S.I., Len, E.G., Kyslovskyy, Ye.M., Reshetnyk, O.V., Vladimirova, T.P., Sheludchenko, B.V., Skakunova, E.S., Lizunov, V.V., Kochelab, E.V., Fodchuk, I.M., Klad’ko, V.P. |
| Format: | Article |
| Language: | English |
| Published: |
Інститут металофізики ім. Г.В. Курдюмова НАН України
2016
|
| Subjects: | |
| Online Access: | https://nasplib.isofts.kiev.ua/handle/123456789/112466 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Journal Title: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Cite this: | Dynamical Theory of Triple-Crystal X-ray Diffractometry and Characterization of Microdefects and Strains in Imperfect Single Crystals / V. B. Molodkin, S. I. Olikhovskii, E. G. Len, Ye. M. Kyslovskyy, O. V. Reshetnyk, T. P. Vladimirova, B. V. Sheludchenko, E. S. Skakunova, V. V. Lizunov, E. V. Kochelab, I. M. Fodchuk, and V. P. Klad’ko // Металлофизика и новейшие технологии. — 2016. — Т. 38, № 1. — С. 99-139. — Бібліогр.: 48 назв. — англ. |
Institution
Digital Library of Periodicals of National Academy of Sciences of UkraineSimilar Items
-
Double- and triple-crystal X-ray diffractometry of microdefects in silicon
by: V. B. Molodkin, et al.
Published: (2010) -
Double- and triple-crystal X-ray diffractometry of microdefects in silicon
by: Molodkin, V.B., et al.
Published: (2010) -
New Performance Capabilities of Integral Dynamical Diffractometry of Crystal Imperfections
by: V. V. Lizunov, et al.
Published: (2015) -
Transformations of microdefect structure in silicon crystals under the influence of weak magnetic field
by: Vladimirova, T.P., et al.
Published: (2011) -
Dispersion (Phase) Nature of Structural Sensitivity and Informativity of Triple-Crystal Diffractometry of Defects and Strains within the Ion-Implanted Films
by: O. S. Skakunova, et al.
Published: (2015)