Characteristics of interface corrugations in short-period GaAs/AlAs superlattices

• Published in: Semiconductor Physics Quantum Electronics & Optoelectronics
• Date: 1998
• Main Authors: Daweritz, L., Grahn, H., Hey, R., Jenichen, B., Ploog, K., Korbutyak, D., Krylyuk, S., Kryuchenko, Yu., Litovchenko, V.
• Format: Article
• Language: English
• Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 1998
• Online Access: https://nasplib.isofts.kiev.ua/handle/123456789/114668
• Journal Title: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Cite this: Characteristics of interface corrugations in short-period GaAs/AlAs superlattices / L. Daweritz, H. Grahn, R. Hey, B. Jenichen, K. Ploog, D. Korbutyak, S. Krylyuk, Yu. Kryuchenko, V. Litovchenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1998. — Т. 1, № 1. — С. 45-49. — Бібліогр.: 12 назв. — англ.

GaAs/AlAs supelattices with corrugated interfaces have been investigated by the polarized photoluminescence method. Using the theoretical approach, which associates the linear polarization of exciton photoluminescence with the corrugation parameters, experimental results have been fitted to determin...