Gorbach, T., Holiney, R., Matiyuk, I., Matveeva, L., Svechnikov, S., & Venger, E. (1998). Electroreflectance spectroscopy and scanning electron microscopy study of microrelief silicon wafers with various surface pretreatments. Semiconductor Physics Quantum Electronics & Optoelectronics.
Чикаго стиль цитування (17-те видання)Gorbach, T.Ya, R.Yu Holiney, I.M Matiyuk, L.A Matveeva, S.V Svechnikov, та E.F Venger. "Electroreflectance Spectroscopy and Scanning Electron Microscopy Study of Microrelief Silicon Wafers with Various Surface Pretreatments." Semiconductor Physics Quantum Electronics & Optoelectronics 1998.
Стиль цитування MLA (8-ме видання)Gorbach, T.Ya, et al. "Electroreflectance Spectroscopy and Scanning Electron Microscopy Study of Microrelief Silicon Wafers with Various Surface Pretreatments." Semiconductor Physics Quantum Electronics & Optoelectronics, 1998.