APA (7th ed.) Citation

Gorbach, T., Holiney, R., Matiyuk, I., Matveeva, L., Svechnikov, S., & Venger, E. (1998). Electroreflectance spectroscopy and scanning electron microscopy study of microrelief silicon wafers with various surface pretreatments. Semiconductor Physics Quantum Electronics & Optoelectronics.

Chicago Style (17th ed.) Citation

Gorbach, T.Ya, R.Yu Holiney, I.M Matiyuk, L.A Matveeva, S.V Svechnikov, and E.F Venger. "Electroreflectance Spectroscopy and Scanning Electron Microscopy Study of Microrelief Silicon Wafers with Various Surface Pretreatments." Semiconductor Physics Quantum Electronics & Optoelectronics 1998.

MLA (8th ed.) Citation

Gorbach, T.Ya, et al. "Electroreflectance Spectroscopy and Scanning Electron Microscopy Study of Microrelief Silicon Wafers with Various Surface Pretreatments." Semiconductor Physics Quantum Electronics & Optoelectronics, 1998.

Warning: These citations may not always be 100% accurate.