Safriuk, N., Stanchu, G., Kuchuk, A., Kladko, V., Belyaev, A., & Machulin, V. (2013). X-ray diffraction investigation of GaN layers on Si(111) and Al₂O₃ (0001) substrates. Semiconductor Physics Quantum Electronics & Optoelectronics.
Chicago-Zitierstil (17. Ausg.)Safriuk, N.V, G.V Stanchu, A.V Kuchuk, V.P Kladko, A.E Belyaev, und V.F Machulin. "X-ray Diffraction Investigation of GaN Layers on Si(111) and Al₂O₃ (0001) Substrates." Semiconductor Physics Quantum Electronics & Optoelectronics 2013.
MLA-Zitierstil (8. Ausg.)Safriuk, N.V, et al. "X-ray Diffraction Investigation of GaN Layers on Si(111) and Al₂O₃ (0001) Substrates." Semiconductor Physics Quantum Electronics & Optoelectronics, 2013.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.