APA (7th ed.) Citation

Goloborodko, N., Grygoruk, V., Kurashov, V., Podanchuk, D., Goloborodko, A., & Kotov, M. (2010). Determination of surface defects by using the wavefront scanner. Semiconductor Physics Quantum Electronics & Optoelectronics.

Chicago Style (17th ed.) Citation

Goloborodko, N.S, V.I Grygoruk, V.N Kurashov, D.V Podanchuk, A.A Goloborodko, and M.M Kotov. "Determination of Surface Defects by Using the Wavefront Scanner." Semiconductor Physics Quantum Electronics & Optoelectronics 2010.

MLA (8th ed.) Citation

Goloborodko, N.S, et al. "Determination of Surface Defects by Using the Wavefront Scanner." Semiconductor Physics Quantum Electronics & Optoelectronics, 2010.

Warning: These citations may not always be 100% accurate.