Goloborodko, N., Grygoruk, V., Kurashov, V., Podanchuk, D., Goloborodko, A., & Kotov, M. (2010). Determination of surface defects by using the wavefront scanner. Semiconductor Physics Quantum Electronics & Optoelectronics.
Chicago-Zitierstil (17. Ausg.)Goloborodko, N.S, V.I Grygoruk, V.N Kurashov, D.V Podanchuk, A.A Goloborodko, und M.M Kotov. "Determination of Surface Defects by Using the Wavefront Scanner." Semiconductor Physics Quantum Electronics & Optoelectronics 2010.
MLA-Zitierstil (8. Ausg.)Goloborodko, N.S, et al. "Determination of Surface Defects by Using the Wavefront Scanner." Semiconductor Physics Quantum Electronics & Optoelectronics, 2010.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.