Determination of surface defects by using the wavefront scanner

• Veröffentlicht in: Semiconductor Physics Quantum Electronics & Optoelectronics
• Datum: 2010
• ISSN: 1560-8034
• Hauptverfasser: Goloborodko, N.S., Grygoruk, V.I., Kurashov, V.N., Podanchuk, D.V., Goloborodko, A.A., Kotov, M.M.
• Format: Artikel
• Sprache: Englisch
• Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2010
• Online Zugang: https://nasplib.isofts.kiev.ua/handle/123456789/117744
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Zitieren: Determination of surface defects by using the wavefront scanner / N.S. Goloborodko, V.I. Grygoruk, V.N. Kurashov, D.V. Podanchuk, A.A. Goloborodko, M.M. Kotov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 1. — С. 65-69. — Бібліогр.: 10 назв. — англ.

The possibility of changes in the polarization state of the laser beam reflected
 from inhomogeneity with the refractive index gradient is theoretically shown, which
 allows separating the phase shifts related with relief inhomogeneities and local changes
 of the surface refr...