Polarization and angular peculiarities of IR emission of thin film semiconductor structures

• Опубліковано в: : Semiconductor Physics Quantum Electronics & Optoelectronics
• Дата: 2003
• Автори: Kollyukh, O.G., Liptuga, A.I., Morozhenko, V.O., Pipa, V.I.
• Формат: Стаття
• Мова: English
• Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2003
• Онлайн доступ: https://nasplib.isofts.kiev.ua/handle/123456789/118020
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Цитувати: Polarization and angular peculiarities of IR emission of thin film semiconductor structures / O.G. Kollyukh, A.I. Liptuga, V.O. Morozhenko, V.I. Pipa // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 2. — С. 210-213. — Бібліогр.: 6 назв. — англ.

In this paper thermal radiation from plane-parallel semiconductor layers was investigated. Shown is that spectra of thermal radiation from structures has an oscillating character caused by multi-beam interference. It was shown that the density of thermal radiation, at its interference maximum, can b...