Polarization and angular peculiarities of IR emission of thin film semiconductor structures

In this paper thermal radiation from plane-parallel semiconductor layers was investigated. Shown is that spectra of thermal radiation from structures has an oscillating character caused by multi-beam interference. It was shown that the density of thermal radiation, at its interference maximum, can b...

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Опубліковано в: :Semiconductor Physics Quantum Electronics & Optoelectronics
Дата:2003
Автори: Kollyukh, O.G., Liptuga, A.I., Morozhenko, V.O., Pipa, V.I.
Формат: Стаття
Мова:English
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2003
Онлайн доступ:https://nasplib.isofts.kiev.ua/handle/123456789/118020
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Polarization and angular peculiarities of IR emission of thin film semiconductor structures / O.G. Kollyukh, A.I. Liptuga, V.O. Morozhenko, V.I. Pipa // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 2. — С. 210-213. — Бібліогр.: 6 назв. — англ.

Репозитарії

Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-118020
record_format dspace
spelling Kollyukh, O.G.
Liptuga, A.I.
Morozhenko, V.O.
Pipa, V.I.
2017-05-28T06:16:43Z
2017-05-28T06:16:43Z
2003
Polarization and angular peculiarities of IR emission of thin film semiconductor structures / O.G. Kollyukh, A.I. Liptuga, V.O. Morozhenko, V.I. Pipa // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 2. — С. 210-213. — Бібліогр.: 6 назв. — англ.
1560-8034
PACS: 78.30.A,F, 78.55.A, 61.80.B
https://nasplib.isofts.kiev.ua/handle/123456789/118020
In this paper thermal radiation from plane-parallel semiconductor layers was investigated. Shown is that spectra of thermal radiation from structures has an oscillating character caused by multi-beam interference. It was shown that the density of thermal radiation, at its interference maximum, can be equal to half the density of thermal radiation from a blackbody source, at the same time at the interference minimum the value approached practically zero. In addition, the angular dependence of thermal radiation does not obey the Lambert law and demonstrates a non-monotonic character with clearly pronounced extrema.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Polarization and angular peculiarities of IR emission of thin film semiconductor structures
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title Polarization and angular peculiarities of IR emission of thin film semiconductor structures
spellingShingle Polarization and angular peculiarities of IR emission of thin film semiconductor structures
Kollyukh, O.G.
Liptuga, A.I.
Morozhenko, V.O.
Pipa, V.I.
title_short Polarization and angular peculiarities of IR emission of thin film semiconductor structures
title_full Polarization and angular peculiarities of IR emission of thin film semiconductor structures
title_fullStr Polarization and angular peculiarities of IR emission of thin film semiconductor structures
title_full_unstemmed Polarization and angular peculiarities of IR emission of thin film semiconductor structures
title_sort polarization and angular peculiarities of ir emission of thin film semiconductor structures
author Kollyukh, O.G.
Liptuga, A.I.
Morozhenko, V.O.
Pipa, V.I.
author_facet Kollyukh, O.G.
Liptuga, A.I.
Morozhenko, V.O.
Pipa, V.I.
publishDate 2003
language English
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
format Article
description In this paper thermal radiation from plane-parallel semiconductor layers was investigated. Shown is that spectra of thermal radiation from structures has an oscillating character caused by multi-beam interference. It was shown that the density of thermal radiation, at its interference maximum, can be equal to half the density of thermal radiation from a blackbody source, at the same time at the interference minimum the value approached practically zero. In addition, the angular dependence of thermal radiation does not obey the Lambert law and demonstrates a non-monotonic character with clearly pronounced extrema.
issn 1560-8034
url https://nasplib.isofts.kiev.ua/handle/123456789/118020
citation_txt Polarization and angular peculiarities of IR emission of thin film semiconductor structures / O.G. Kollyukh, A.I. Liptuga, V.O. Morozhenko, V.I. Pipa // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 2. — С. 210-213. — Бібліогр.: 6 назв. — англ.
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