High-temperature injection spectroscopy of deep traps in CdTe polycrystalline films
The paper provides the direct experimental method to determine the localized state energy distribution function for semiconducting solid materials based on space-charge-limited current-voltage characteristics. The current-voltage characteristics would be obtained under the random temperatures. The T...
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| Veröffentlicht in: | Semiconductor Physics Quantum Electronics & Optoelectronics |
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| Datum: | 2003 |
| Hauptverfasser: | , , |
| Format: | Artikel |
| Sprache: | English |
| Veröffentlicht: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2003
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| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/118084 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | High-temperature injection spectroscopy of deep traps in CdTe polycrystalline films / A.S. Opanasyuk, N.N. Opanasyuk, N.V. Tirkusova // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 4. — С. 444-449. — Бібліогр.: 18 назв. — англ. |
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