Optical recording of information pits in thin layers of chalcogenide semiconductors
The paper is devoted to the theoretical consideration of the question how to record pits with the necessary height profile in photosensitive materials by varying their heat conductivity, photosensitivity, optical absorption, as well as the recording gaussian beam intensity,
 radius and expos...
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| Veröffentlicht in: | Semiconductor Physics Quantum Electronics & Optoelectronics |
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| Datum: | 2004 |
| Hauptverfasser: | , , , , , , |
| Format: | Artikel |
| Sprache: | Englisch |
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Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2004
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| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/118142 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Optical recording of information pits in thin layers of chalcogenide semiconductors / A.N. Morozovska, S.A. Kostyukevych, L.L. Nikitenko, A.A. Kryuchin, A.A. Kudryavtsev, P.E. Shepeliavyi, N.L. Moskalenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2004. — Т. 7, № 1. — С. 93-100. — Бібліогр.: 18 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| _version_ | 1862633650593464320 |
|---|---|
| author | Morozovska, A.N. Kostyukevych, S.A. Nikitenko, L.L. Kryuchin, A.A. Kudryavtsev, A.A. Shepeliavyi, P.E. Moskalenko, N.L. |
| author_facet | Morozovska, A.N. Kostyukevych, S.A. Nikitenko, L.L. Kryuchin, A.A. Kudryavtsev, A.A. Shepeliavyi, P.E. Moskalenko, N.L. |
| citation_txt | Optical recording of information pits in thin layers of chalcogenide semiconductors / A.N. Morozovska, S.A. Kostyukevych, L.L. Nikitenko, A.A. Kryuchin, A.A. Kudryavtsev, P.E. Shepeliavyi, N.L. Moskalenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2004. — Т. 7, № 1. — С. 93-100. — Бібліогр.: 18 назв. — англ. |
| collection | DSpace DC |
| container_title | Semiconductor Physics Quantum Electronics & Optoelectronics |
| description | The paper is devoted to the theoretical consideration of the question how to record pits with the necessary height profile in photosensitive materials by varying their heat conductivity, photosensitivity, optical absorption, as well as the recording gaussian beam intensity,
radius and exposure time. A rather simple analytical expression for the height profile of pits has been derived. It has been shown that this profile depending on photosensitive material parameters and recording beam characteristics could be almost rectangular, flat with rounding edges, spherical or parabolic. The proposed model describes adequately the height profile of pits recorded in thin layer chalcogenide semiconductors by a gaussian laser beam.
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| first_indexed | 2025-11-30T14:41:11Z |
| format | Article |
| fulltext | |
| id | nasplib_isofts_kiev_ua-123456789-118142 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 1560-8034 |
| language | English |
| last_indexed | 2025-11-30T14:41:11Z |
| publishDate | 2004 |
| publisher | Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| record_format | dspace |
| spelling | Morozovska, A.N. Kostyukevych, S.A. Nikitenko, L.L. Kryuchin, A.A. Kudryavtsev, A.A. Shepeliavyi, P.E. Moskalenko, N.L. 2017-05-28T18:31:38Z 2017-05-28T18:31:38Z 2004 Optical recording of information pits in thin layers of chalcogenide semiconductors / A.N. Morozovska, S.A. Kostyukevych, L.L. Nikitenko, A.A. Kryuchin, A.A. Kudryavtsev, P.E. Shepeliavyi, N.L. Moskalenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2004. — Т. 7, № 1. — С. 93-100. — Бібліогр.: 18 назв. — англ. 1560-8034 PACS: 42.40.Ht https://nasplib.isofts.kiev.ua/handle/123456789/118142 The paper is devoted to the theoretical consideration of the question how to record pits with the necessary height profile in photosensitive materials by varying their heat conductivity, photosensitivity, optical absorption, as well as the recording gaussian beam intensity,
 radius and exposure time. A rather simple analytical expression for the height profile of pits has been derived. It has been shown that this profile depending on photosensitive material parameters and recording beam characteristics could be almost rectangular, flat with rounding edges, spherical or parabolic. The proposed model describes adequately the height profile of pits recorded in thin layer chalcogenide semiconductors by a gaussian laser beam. en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics Optical recording of information pits in thin layers of chalcogenide semiconductors Article published earlier |
| spellingShingle | Optical recording of information pits in thin layers of chalcogenide semiconductors Morozovska, A.N. Kostyukevych, S.A. Nikitenko, L.L. Kryuchin, A.A. Kudryavtsev, A.A. Shepeliavyi, P.E. Moskalenko, N.L. |
| title | Optical recording of information pits in thin layers of chalcogenide semiconductors |
| title_full | Optical recording of information pits in thin layers of chalcogenide semiconductors |
| title_fullStr | Optical recording of information pits in thin layers of chalcogenide semiconductors |
| title_full_unstemmed | Optical recording of information pits in thin layers of chalcogenide semiconductors |
| title_short | Optical recording of information pits in thin layers of chalcogenide semiconductors |
| title_sort | optical recording of information pits in thin layers of chalcogenide semiconductors |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/118142 |
| work_keys_str_mv | AT morozovskaan opticalrecordingofinformationpitsinthinlayersofchalcogenidesemiconductors AT kostyukevychsa opticalrecordingofinformationpitsinthinlayersofchalcogenidesemiconductors AT nikitenkoll opticalrecordingofinformationpitsinthinlayersofchalcogenidesemiconductors AT kryuchinaa opticalrecordingofinformationpitsinthinlayersofchalcogenidesemiconductors AT kudryavtsevaa opticalrecordingofinformationpitsinthinlayersofchalcogenidesemiconductors AT shepeliavyipe opticalrecordingofinformationpitsinthinlayersofchalcogenidesemiconductors AT moskalenkonl opticalrecordingofinformationpitsinthinlayersofchalcogenidesemiconductors |