Optical recording of information pits in thin layers of chalcogenide semiconductors

The paper is devoted to the theoretical consideration of the question how to record pits with the necessary height profile in photosensitive materials by varying their heat conductivity, photosensitivity, optical absorption, as well as the recording gaussian beam intensity,
 radius and expos...

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Published in:Semiconductor Physics Quantum Electronics & Optoelectronics
Date:2004
Main Authors: Morozovska, A.N., Kostyukevych, S.A., Nikitenko, L.L., Kryuchin, A.A., Kudryavtsev, A.A., Shepeliavyi, P.E., Moskalenko, N.L.
Format: Article
Language:English
Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2004
Online Access:https://nasplib.isofts.kiev.ua/handle/123456789/118142
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:Optical recording of information pits in thin layers of chalcogenide semiconductors / A.N. Morozovska, S.A. Kostyukevych, L.L. Nikitenko, A.A. Kryuchin, A.A. Kudryavtsev, P.E. Shepeliavyi, N.L. Moskalenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2004. — Т. 7, № 1. — С. 93-100. — Бібліогр.: 18 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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author Morozovska, A.N.
Kostyukevych, S.A.
Nikitenko, L.L.
Kryuchin, A.A.
Kudryavtsev, A.A.
Shepeliavyi, P.E.
Moskalenko, N.L.
author_facet Morozovska, A.N.
Kostyukevych, S.A.
Nikitenko, L.L.
Kryuchin, A.A.
Kudryavtsev, A.A.
Shepeliavyi, P.E.
Moskalenko, N.L.
citation_txt Optical recording of information pits in thin layers of chalcogenide semiconductors / A.N. Morozovska, S.A. Kostyukevych, L.L. Nikitenko, A.A. Kryuchin, A.A. Kudryavtsev, P.E. Shepeliavyi, N.L. Moskalenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2004. — Т. 7, № 1. — С. 93-100. — Бібліогр.: 18 назв. — англ.
collection DSpace DC
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
description The paper is devoted to the theoretical consideration of the question how to record pits with the necessary height profile in photosensitive materials by varying their heat conductivity, photosensitivity, optical absorption, as well as the recording gaussian beam intensity,
 radius and exposure time. A rather simple analytical expression for the height profile of pits has been derived. It has been shown that this profile depending on photosensitive material parameters and recording beam characteristics could be almost rectangular, flat with rounding edges, spherical or parabolic. The proposed model describes adequately the height profile of pits recorded in thin layer chalcogenide semiconductors by a gaussian laser beam.
first_indexed 2025-11-30T14:41:11Z
format Article
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institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
issn 1560-8034
language English
last_indexed 2025-11-30T14:41:11Z
publishDate 2004
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
record_format dspace
spelling Morozovska, A.N.
Kostyukevych, S.A.
Nikitenko, L.L.
Kryuchin, A.A.
Kudryavtsev, A.A.
Shepeliavyi, P.E.
Moskalenko, N.L.
2017-05-28T18:31:38Z
2017-05-28T18:31:38Z
2004
Optical recording of information pits in thin layers of chalcogenide semiconductors / A.N. Morozovska, S.A. Kostyukevych, L.L. Nikitenko, A.A. Kryuchin, A.A. Kudryavtsev, P.E. Shepeliavyi, N.L. Moskalenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2004. — Т. 7, № 1. — С. 93-100. — Бібліогр.: 18 назв. — англ.
1560-8034
PACS: 42.40.Ht
https://nasplib.isofts.kiev.ua/handle/123456789/118142
The paper is devoted to the theoretical consideration of the question how to record pits with the necessary height profile in photosensitive materials by varying their heat conductivity, photosensitivity, optical absorption, as well as the recording gaussian beam intensity,
 radius and exposure time. A rather simple analytical expression for the height profile of pits has been derived. It has been shown that this profile depending on photosensitive material parameters and recording beam characteristics could be almost rectangular, flat with rounding edges, spherical or parabolic. The proposed model describes adequately the height profile of pits recorded in thin layer chalcogenide semiconductors by a gaussian laser beam.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Optical recording of information pits in thin layers of chalcogenide semiconductors
Article
published earlier
spellingShingle Optical recording of information pits in thin layers of chalcogenide semiconductors
Morozovska, A.N.
Kostyukevych, S.A.
Nikitenko, L.L.
Kryuchin, A.A.
Kudryavtsev, A.A.
Shepeliavyi, P.E.
Moskalenko, N.L.
title Optical recording of information pits in thin layers of chalcogenide semiconductors
title_full Optical recording of information pits in thin layers of chalcogenide semiconductors
title_fullStr Optical recording of information pits in thin layers of chalcogenide semiconductors
title_full_unstemmed Optical recording of information pits in thin layers of chalcogenide semiconductors
title_short Optical recording of information pits in thin layers of chalcogenide semiconductors
title_sort optical recording of information pits in thin layers of chalcogenide semiconductors
url https://nasplib.isofts.kiev.ua/handle/123456789/118142
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AT kostyukevychsa opticalrecordingofinformationpitsinthinlayersofchalcogenidesemiconductors
AT nikitenkoll opticalrecordingofinformationpitsinthinlayersofchalcogenidesemiconductors
AT kryuchinaa opticalrecordingofinformationpitsinthinlayersofchalcogenidesemiconductors
AT kudryavtsevaa opticalrecordingofinformationpitsinthinlayersofchalcogenidesemiconductors
AT shepeliavyipe opticalrecordingofinformationpitsinthinlayersofchalcogenidesemiconductors
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