Residual stresses and piezoelectric properties of the HgCdTe – based compound heterostructures under the anisotropic deformation restriction

Narrow-gap mercury cadmium telluride thin films grown by MBE methods
 onto various substrates (HgCdTe/Si, HgCdTe/GaAs) were investigated as a piezoelectric
 heterostructure for IR detection. Mechanical stresses at the layer-substrate interface were
 analyzed. It was determine...

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Published in:Semiconductor Physics Quantum Electronics & Optoelectronics
Date:2012
Main Author: Smirnov, A. B.
Format: Article
Language:English
Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2012
Online Access:https://nasplib.isofts.kiev.ua/handle/123456789/118306
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:Residual stresses and piezoelectric properties of the HgCdTe –
 based compound heterostructures under the anisotropic
 deformation restriction/ A. B. Smirnov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 2. — С. 170-175. — Бібліогр.: 22 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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author Smirnov, A. B.
author_facet Smirnov, A. B.
citation_txt Residual stresses and piezoelectric properties of the HgCdTe –
 based compound heterostructures under the anisotropic
 deformation restriction/ A. B. Smirnov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 2. — С. 170-175. — Бібліогр.: 22 назв. — англ.
collection DSpace DC
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
description Narrow-gap mercury cadmium telluride thin films grown by MBE methods
 onto various substrates (HgCdTe/Si, HgCdTe/GaAs) were investigated as a piezoelectric
 heterostructure for IR detection. Mechanical stresses at the layer-substrate interface were
 analyzed. It was determined that for [310] oriented MCT-based structures under the
 anisotropic restriction of the deformation the nonzero shear components of the strain
 tensor arise and stress induced piezoelectric polarization is generated. Existence of the
 built-in electric field in the strained MCT-based heterostructure results in the spatial
 separation of the nonequilibrium carriers and the possibility of the room temperature
 detection of the IR radiation is realized.
first_indexed 2025-12-07T16:36:24Z
format Article
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id nasplib_isofts_kiev_ua-123456789-118306
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
issn 1560-8034
language English
last_indexed 2025-12-07T16:36:24Z
publishDate 2012
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
record_format dspace
spelling Smirnov, A. B.
2017-05-29T16:41:56Z
2017-05-29T16:41:56Z
2012
Residual stresses and piezoelectric properties of the HgCdTe –
 based compound heterostructures under the anisotropic
 deformation restriction/ A. B. Smirnov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 2. — С. 170-175. — Бібліогр.: 22 назв. — англ.
1560-8034
PACS 72.40.+w, 77.65.Ly, 81.05.Dz
https://nasplib.isofts.kiev.ua/handle/123456789/118306
Narrow-gap mercury cadmium telluride thin films grown by MBE methods
 onto various substrates (HgCdTe/Si, HgCdTe/GaAs) were investigated as a piezoelectric
 heterostructure for IR detection. Mechanical stresses at the layer-substrate interface were
 analyzed. It was determined that for [310] oriented MCT-based structures under the
 anisotropic restriction of the deformation the nonzero shear components of the strain
 tensor arise and stress induced piezoelectric polarization is generated. Existence of the
 built-in electric field in the strained MCT-based heterostructure results in the spatial
 separation of the nonequilibrium carriers and the possibility of the room temperature
 detection of the IR radiation is realized.
The authors would like to express their thanks Dr R Savkina all her critical help in the process writing.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Residual stresses and piezoelectric properties of the HgCdTe – based compound heterostructures under the anisotropic deformation restriction
Article
published earlier
spellingShingle Residual stresses and piezoelectric properties of the HgCdTe – based compound heterostructures under the anisotropic deformation restriction
Smirnov, A. B.
title Residual stresses and piezoelectric properties of the HgCdTe – based compound heterostructures under the anisotropic deformation restriction
title_full Residual stresses and piezoelectric properties of the HgCdTe – based compound heterostructures under the anisotropic deformation restriction
title_fullStr Residual stresses and piezoelectric properties of the HgCdTe – based compound heterostructures under the anisotropic deformation restriction
title_full_unstemmed Residual stresses and piezoelectric properties of the HgCdTe – based compound heterostructures under the anisotropic deformation restriction
title_short Residual stresses and piezoelectric properties of the HgCdTe – based compound heterostructures under the anisotropic deformation restriction
title_sort residual stresses and piezoelectric properties of the hgcdte – based compound heterostructures under the anisotropic deformation restriction
url https://nasplib.isofts.kiev.ua/handle/123456789/118306
work_keys_str_mv AT smirnovab residualstressesandpiezoelectricpropertiesofthehgcdtebasedcompoundheterostructuresundertheanisotropicdeformationrestriction