Features of Auger-emission in channeling

Shown in this paper is the influence of channeling effect on formation of the
 signal for low- and high-energy Auger-electrons observed in monocrystalline silicon. It
 has been ascertained the anisotropic (wave-like) character of the yield value for lowenergy
 Auger-electrons...

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Бібліографічні деталі
Опубліковано в: :Semiconductor Physics Quantum Electronics & Optoelectronics
Дата:2014
Автори: Kossko, I.A., Denisov, A.Ye.
Формат: Стаття
Мова:Англійська
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2014
Онлайн доступ:https://nasplib.isofts.kiev.ua/handle/123456789/118361
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Features of Auger-emission in channeling / I.A. Kossko, A.Ye. Denisov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 1. — С. 97-99. — Бібліогр.: 6 назв. — англ.

Репозитарії

Digital Library of Periodicals of National Academy of Sciences of Ukraine
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author Kossko, I.A.
Denisov, A.Ye.
author_facet Kossko, I.A.
Denisov, A.Ye.
citation_txt Features of Auger-emission in channeling / I.A. Kossko, A.Ye. Denisov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 1. — С. 97-99. — Бібліогр.: 6 назв. — англ.
collection DSpace DC
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
description Shown in this paper is the influence of channeling effect on formation of the
 signal for low- and high-energy Auger-electrons observed in monocrystalline silicon. It
 has been ascertained the anisotropic (wave-like) character of the yield value for lowenergy
 Auger-electrons in silicon, when changing the angle of acting initial radiation
 during sample rotation.
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language English
last_indexed 2025-12-07T15:25:35Z
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publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
record_format dspace
spelling Kossko, I.A.
Denisov, A.Ye.
2017-05-30T05:45:39Z
2017-05-30T05:45:39Z
2014
Features of Auger-emission in channeling / I.A. Kossko, A.Ye. Denisov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 1. — С. 97-99. — Бібліогр.: 6 назв. — англ.
1560-8034
Features of Auger-emission in channeling
https://nasplib.isofts.kiev.ua/handle/123456789/118361
Shown in this paper is the influence of channeling effect on formation of the
 signal for low- and high-energy Auger-electrons observed in monocrystalline silicon. It
 has been ascertained the anisotropic (wave-like) character of the yield value for lowenergy
 Auger-electrons in silicon, when changing the angle of acting initial radiation
 during sample rotation.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Features of Auger-emission in channeling
Article
published earlier
spellingShingle Features of Auger-emission in channeling
Kossko, I.A.
Denisov, A.Ye.
title Features of Auger-emission in channeling
title_full Features of Auger-emission in channeling
title_fullStr Features of Auger-emission in channeling
title_full_unstemmed Features of Auger-emission in channeling
title_short Features of Auger-emission in channeling
title_sort features of auger-emission in channeling
url https://nasplib.isofts.kiev.ua/handle/123456789/118361
work_keys_str_mv AT kosskoia featuresofaugeremissioninchanneling
AT denisovaye featuresofaugeremissioninchanneling