Optical properties of thin films of titanium with transient layers on them

Within the Beattie spectroellipsometric method, we measured the ellipsometric
 parameters of thin Ті films deposited onto glass substrates by magnetron sputtering in
 argon atmosphere. Measurements were carried out at five angles of incidence with light
 from the visible and...

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Бібліографічні деталі
Опубліковано в: :Semiconductor Physics Quantum Electronics & Optoelectronics
Дата:2010
Автори: Lendel, V.V., Lomakina, O.V., Mel’nychenko, L.Yu., Shaykevich, I.A.
Формат: Стаття
Мова:Англійська
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2010
Онлайн доступ:https://nasplib.isofts.kiev.ua/handle/123456789/118394
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Optical properties of thin films of titanium
 with transient layers on them /V.V. Lendel, O.V. Lomakina, L.Yu. Mel’nychenko, I.A. Shaykevich // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 3. — С. 231-234. — Бібліогр.: 9 назв. — англ.

Репозитарії

Digital Library of Periodicals of National Academy of Sciences of Ukraine
_version_ 1862740665543163904
author Lendel, V.V.
Lomakina, O.V.
Mel’nychenko, L.Yu.
Shaykevich, I.A.
author_facet Lendel, V.V.
Lomakina, O.V.
Mel’nychenko, L.Yu.
Shaykevich, I.A.
citation_txt Optical properties of thin films of titanium
 with transient layers on them /V.V. Lendel, O.V. Lomakina, L.Yu. Mel’nychenko, I.A. Shaykevich // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 3. — С. 231-234. — Бібліогр.: 9 назв. — англ.
collection DSpace DC
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
description Within the Beattie spectroellipsometric method, we measured the ellipsometric
 parameters of thin Ті films deposited onto glass substrates by magnetron sputtering in
 argon atmosphere. Measurements were carried out at five angles of incidence with light
 from the visible and ultraviolet ranges of the spectrum. Using the Airy recurrent
 formulas, we solved the inverse problem of ellipsometry for a three-layer model of films.
 The model includes nine unknown quantities – three thicknesses of layers and six optical
 constants, namely: the refractive and absorption indices of all these layers. The results
 obtained show that the upper layer being in contact with air consists of titanium oxide of
 the TiO₂ type, the second layer is made of pure metallic titanium, and, finally, the third
 layer adjoining the glass substrate is also oxide TiO₂. It is worth noting that the optical
 constants of the second layer are practically identical to those of massive Ті. The
 calculations of the film thicknesses and optical constants by using the one-layer model
 gave the values significantly different from the optical constants of massive titanium. In
 addition, the studies of both the electric conductance of the prepared Ті films and
 morphology of their surface with an atomic force microscope were carried out.
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institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
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language English
last_indexed 2025-12-07T20:16:23Z
publishDate 2010
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
record_format dspace
spelling Lendel, V.V.
Lomakina, O.V.
Mel’nychenko, L.Yu.
Shaykevich, I.A.
2017-05-30T06:51:18Z
2017-05-30T06:51:18Z
2010
Optical properties of thin films of titanium
 with transient layers on them /V.V. Lendel, O.V. Lomakina, L.Yu. Mel’nychenko, I.A. Shaykevich // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 3. — С. 231-234. — Бібліогр.: 9 назв. — англ.
1560-8034
PACS 42.79.Wc, 68.55.jd, 78.20.Ci
https://nasplib.isofts.kiev.ua/handle/123456789/118394
Within the Beattie spectroellipsometric method, we measured the ellipsometric
 parameters of thin Ті films deposited onto glass substrates by magnetron sputtering in
 argon atmosphere. Measurements were carried out at five angles of incidence with light
 from the visible and ultraviolet ranges of the spectrum. Using the Airy recurrent
 formulas, we solved the inverse problem of ellipsometry for a three-layer model of films.
 The model includes nine unknown quantities – three thicknesses of layers and six optical
 constants, namely: the refractive and absorption indices of all these layers. The results
 obtained show that the upper layer being in contact with air consists of titanium oxide of
 the TiO₂ type, the second layer is made of pure metallic titanium, and, finally, the third
 layer adjoining the glass substrate is also oxide TiO₂. It is worth noting that the optical
 constants of the second layer are practically identical to those of massive Ті. The
 calculations of the film thicknesses and optical constants by using the one-layer model
 gave the values significantly different from the optical constants of massive titanium. In
 addition, the studies of both the electric conductance of the prepared Ті films and
 morphology of their surface with an atomic force microscope were carried out.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Optical properties of thin films of titanium with transient layers on them
Article
published earlier
spellingShingle Optical properties of thin films of titanium with transient layers on them
Lendel, V.V.
Lomakina, O.V.
Mel’nychenko, L.Yu.
Shaykevich, I.A.
title Optical properties of thin films of titanium with transient layers on them
title_full Optical properties of thin films of titanium with transient layers on them
title_fullStr Optical properties of thin films of titanium with transient layers on them
title_full_unstemmed Optical properties of thin films of titanium with transient layers on them
title_short Optical properties of thin films of titanium with transient layers on them
title_sort optical properties of thin films of titanium with transient layers on them
url https://nasplib.isofts.kiev.ua/handle/123456789/118394
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AT lomakinaov opticalpropertiesofthinfilmsoftitaniumwithtransientlayersonthem
AT melnychenkolyu opticalpropertiesofthinfilmsoftitaniumwithtransientlayersonthem
AT shaykevichia opticalpropertiesofthinfilmsoftitaniumwithtransientlayersonthem