Free-volume correlations in positron-sensitive annihilation modes in chalcogenide vitreous semiconductors: on the path from illusions towards realistic physical description

A newly modified correlation equation between defect-related positron lifetime t₂ (ns) defined within two-state model and corresponding radius R (Å) of freevolume positron traps in the full non-linear form or simplified linear-approximated is proved to account for compositional trends in void volume...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Semiconductor Physics Quantum Electronics & Optoelectronics
Datum:2014
Hauptverfasser: Shpotyuk, O.I., Vakiv, M.M., Shpotyuk, M.V., Ingram, A., Filipecki, J., Vaskiv, A.P.
Format: Artikel
Sprache:English
Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2014
Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/118489
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:Free-volume correlations in positron-sensitive annihilation modes in chalcogenide vitreous semiconductors: on the path from illusions towards realistic physical description / O.I. Shpotyuk, M.M. Vakiv, M.V. Shpotyuk, A. Ingram, J. Filipecki, A.P. Vaskiv // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 3. — С. 243-251. — Бібліогр.: 46 назв. — англ.

Institution

Digital Library of Periodicals of National Academy of Sciences of Ukraine