Free-volume correlations in positron-sensitive annihilation modes in chalcogenide vitreous semiconductors: on the path from illusions towards realistic physical description

A newly modified correlation equation between defect-related positron lifetime t₂ (ns) defined within two-state model and corresponding radius R (Å) of freevolume positron traps in the full non-linear form or simplified linear-approximated is proved to account for compositional trends in void volume...

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Veröffentlicht in:Semiconductor Physics Quantum Electronics & Optoelectronics
Datum:2014
Hauptverfasser: Shpotyuk, O.I., Vakiv, M.M., Shpotyuk, M.V., Ingram, A., Filipecki, J., Vaskiv, A.P.
Format: Artikel
Sprache:Englisch
Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2014
Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/118489
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:Free-volume correlations in positron-sensitive annihilation modes
 in chalcogenide vitreous semiconductors:
 on the path from illusions towards realistic physical description / O.I. Shpotyuk, M.M. Vakiv, M.V. Shpotyuk, A. Ingram, J. Filipecki, A.P. Vaskiv // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 3. — С. 243-251. — Бібліогр.: 46 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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author Shpotyuk, O.I.
Vakiv, M.M.
Shpotyuk, M.V.
Ingram, A.
Filipecki, J.
Vaskiv, A.P.
author_facet Shpotyuk, O.I.
Vakiv, M.M.
Shpotyuk, M.V.
Ingram, A.
Filipecki, J.
Vaskiv, A.P.
citation_txt Free-volume correlations in positron-sensitive annihilation modes
 in chalcogenide vitreous semiconductors:
 on the path from illusions towards realistic physical description / O.I. Shpotyuk, M.M. Vakiv, M.V. Shpotyuk, A. Ingram, J. Filipecki, A.P. Vaskiv // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 3. — С. 243-251. — Бібліогр.: 46 назв. — англ.
collection DSpace DC
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
description A newly modified correlation equation between defect-related positron lifetime t₂ (ns) defined within two-state model and corresponding radius R (Å) of freevolume positron traps in the full non-linear form or simplified linear-approximated is proved to account for compositional trends in void volume evolution of chalcogenide semiconductor compounds like binary As-S(Se) glasses. Specific chemical environment of free-volume voids associated with neighbouring network-forming polyhedrons is shown to play a decisive role in this correlation, leading to systematically enhanced estimated void sizes in comparison with typical molecular substrates, such as polymers.
first_indexed 2025-12-07T15:54:49Z
format Article
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id nasplib_isofts_kiev_ua-123456789-118489
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
issn 1560-8034
language English
last_indexed 2025-12-07T15:54:49Z
publishDate 2014
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
record_format dspace
spelling Shpotyuk, O.I.
Vakiv, M.M.
Shpotyuk, M.V.
Ingram, A.
Filipecki, J.
Vaskiv, A.P.
2017-05-30T14:09:43Z
2017-05-30T14:09:43Z
2014
Free-volume correlations in positron-sensitive annihilation modes
 in chalcogenide vitreous semiconductors:
 on the path from illusions towards realistic physical description / O.I. Shpotyuk, M.M. Vakiv, M.V. Shpotyuk, A. Ingram, J. Filipecki, A.P. Vaskiv // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 3. — С. 243-251. — Бібліогр.: 46 назв. — англ.
1560-8034
PACS 61.43.Fs, 62.20.mt, 62.20.Qp, 64.70.pe, 64.70.ph
https://nasplib.isofts.kiev.ua/handle/123456789/118489
A newly modified correlation equation between defect-related positron lifetime t₂ (ns) defined within two-state model and corresponding radius R (Å) of freevolume positron traps in the full non-linear form or simplified linear-approximated is proved to account for compositional trends in void volume evolution of chalcogenide semiconductor compounds like binary As-S(Se) glasses. Specific chemical environment of free-volume voids associated with neighbouring network-forming polyhedrons is shown to play a decisive role in this correlation, leading to systematically enhanced estimated void sizes in comparison with typical molecular substrates, such as polymers.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Free-volume correlations in positron-sensitive annihilation modes in chalcogenide vitreous semiconductors: on the path from illusions towards realistic physical description
Article
published earlier
spellingShingle Free-volume correlations in positron-sensitive annihilation modes in chalcogenide vitreous semiconductors: on the path from illusions towards realistic physical description
Shpotyuk, O.I.
Vakiv, M.M.
Shpotyuk, M.V.
Ingram, A.
Filipecki, J.
Vaskiv, A.P.
title Free-volume correlations in positron-sensitive annihilation modes in chalcogenide vitreous semiconductors: on the path from illusions towards realistic physical description
title_full Free-volume correlations in positron-sensitive annihilation modes in chalcogenide vitreous semiconductors: on the path from illusions towards realistic physical description
title_fullStr Free-volume correlations in positron-sensitive annihilation modes in chalcogenide vitreous semiconductors: on the path from illusions towards realistic physical description
title_full_unstemmed Free-volume correlations in positron-sensitive annihilation modes in chalcogenide vitreous semiconductors: on the path from illusions towards realistic physical description
title_short Free-volume correlations in positron-sensitive annihilation modes in chalcogenide vitreous semiconductors: on the path from illusions towards realistic physical description
title_sort free-volume correlations in positron-sensitive annihilation modes in chalcogenide vitreous semiconductors: on the path from illusions towards realistic physical description
url https://nasplib.isofts.kiev.ua/handle/123456789/118489
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