Heterostructure ohmic contacts to p-CdTe polycrystalline films

Heterostructure contacts p⁺ -PbTe/p-CdTe were prepared using the hot-wall technique on glassceramic substrates. It has been shown that the potential barrier at the p⁺ -PbTe/p-CdTe interface is not formed in the case of heavily doped lead telluride. That allows one to create ohmic heterocontacts...

Повний опис

Збережено в:
Бібліографічні деталі
Опубліковано в: :Semiconductor Physics Quantum Electronics & Optoelectronics
Дата:2014
Автори: Sukach, A.V., Tetyorkin, V.V., Tkachuk, A.I.
Формат: Стаття
Мова:English
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2014
Онлайн доступ:https://nasplib.isofts.kiev.ua/handle/123456789/118495
Теги: Додати тег
Немає тегів, Будьте першим, хто поставить тег для цього запису!
Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Heterostructure ohmic contacts to p-CdTe polycrystalline films / A.V. Sukach, V.V. Tetyorkin, A.I. Tkachuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 3. — С. 268-271. — Бібліогр.: 21 назв. — англ.

Репозитарії

Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-118495
record_format dspace
spelling Sukach, A.V.
Tetyorkin, V.V.
Tkachuk, A.I.
2017-05-30T14:14:31Z
2017-05-30T14:14:31Z
2014
Heterostructure ohmic contacts to p-CdTe polycrystalline films / A.V. Sukach, V.V. Tetyorkin, A.I. Tkachuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 3. — С. 268-271. — Бібліогр.: 21 назв. — англ.
1560-8034
PACS 78.30.Fs, 73.40.-c, 73.61.Ga
https://nasplib.isofts.kiev.ua/handle/123456789/118495
Heterostructure contacts p⁺ -PbTe/p-CdTe were prepared using the hot-wall technique on glassceramic substrates. It has been shown that the potential barrier at the p⁺ -PbTe/p-CdTe interface is not formed in the case of heavily doped lead telluride. That allows one to create ohmic heterocontacts of metal-p⁺ -PbTe/p-CdTe type. The transverse and in-plane transport of carriers has been investigated as a function of bias voltage and temperature. The current-voltage characteristics measured for the transverse arrangement of contacts exhibited ohmic behavior. The current-voltage characteristics of these contacts are determined by unipolar injection of holes from p⁺ -PbTe into p-CdTe. The inplane transport has been explained by presence of potential barriers at the grain boundaries. The potential barrier height has been estimated to be ~0.1 eV at room temperature. The mechanism of carrier transport is thermionic emission.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Heterostructure ohmic contacts to p-CdTe polycrystalline films
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title Heterostructure ohmic contacts to p-CdTe polycrystalline films
spellingShingle Heterostructure ohmic contacts to p-CdTe polycrystalline films
Sukach, A.V.
Tetyorkin, V.V.
Tkachuk, A.I.
title_short Heterostructure ohmic contacts to p-CdTe polycrystalline films
title_full Heterostructure ohmic contacts to p-CdTe polycrystalline films
title_fullStr Heterostructure ohmic contacts to p-CdTe polycrystalline films
title_full_unstemmed Heterostructure ohmic contacts to p-CdTe polycrystalline films
title_sort heterostructure ohmic contacts to p-cdte polycrystalline films
author Sukach, A.V.
Tetyorkin, V.V.
Tkachuk, A.I.
author_facet Sukach, A.V.
Tetyorkin, V.V.
Tkachuk, A.I.
publishDate 2014
language English
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
format Article
description Heterostructure contacts p⁺ -PbTe/p-CdTe were prepared using the hot-wall technique on glassceramic substrates. It has been shown that the potential barrier at the p⁺ -PbTe/p-CdTe interface is not formed in the case of heavily doped lead telluride. That allows one to create ohmic heterocontacts of metal-p⁺ -PbTe/p-CdTe type. The transverse and in-plane transport of carriers has been investigated as a function of bias voltage and temperature. The current-voltage characteristics measured for the transverse arrangement of contacts exhibited ohmic behavior. The current-voltage characteristics of these contacts are determined by unipolar injection of holes from p⁺ -PbTe into p-CdTe. The inplane transport has been explained by presence of potential barriers at the grain boundaries. The potential barrier height has been estimated to be ~0.1 eV at room temperature. The mechanism of carrier transport is thermionic emission.
issn 1560-8034
url https://nasplib.isofts.kiev.ua/handle/123456789/118495
citation_txt Heterostructure ohmic contacts to p-CdTe polycrystalline films / A.V. Sukach, V.V. Tetyorkin, A.I. Tkachuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 3. — С. 268-271. — Бібліогр.: 21 назв. — англ.
work_keys_str_mv AT sukachav heterostructureohmiccontactstopcdtepolycrystallinefilms
AT tetyorkinvv heterostructureohmiccontactstopcdtepolycrystallinefilms
AT tkachukai heterostructureohmiccontactstopcdtepolycrystallinefilms
first_indexed 2025-12-07T16:21:46Z
last_indexed 2025-12-07T16:21:46Z
_version_ 1850867194272940032