Effect of pressure on the characteristics of Schottky barrier diodes made of overcompensated semiconductor

We studied the effect of uniform compression on characteristics of Au–n-Si
 Schottky barrier diodes made of overcompensated semiconductor. It is shown that
 overcompensation is caused by formation of structural defects owing to thermal
 treatment of the initial silicon wafers...

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Veröffentlicht in:Semiconductor Physics Quantum Electronics & Optoelectronics
Datum:2010
Hauptverfasser: Vlasov, S.I., Saparov, F.A., Ismailov, K.A.
Format: Artikel
Sprache:Englisch
Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2010
Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/118563
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Zitieren:Effect of pressure on the characteristics of Schottky barrier diodes
 made of overcompensated semiconductor / S.I. Vlasov, F.A. Saparov, K.A. Ismailov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 4. — С. 363-365. — Бібліогр.: 10 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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author Vlasov, S.I.
Saparov, F.A.
Ismailov, K.A.
author_facet Vlasov, S.I.
Saparov, F.A.
Ismailov, K.A.
citation_txt Effect of pressure on the characteristics of Schottky barrier diodes
 made of overcompensated semiconductor / S.I. Vlasov, F.A. Saparov, K.A. Ismailov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 4. — С. 363-365. — Бібліогр.: 10 назв. — англ.
collection DSpace DC
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
description We studied the effect of uniform compression on characteristics of Au–n-Si
 Schottky barrier diodes made of overcompensated semiconductor. It is shown that
 overcompensation is caused by formation of structural defects owing to thermal
 treatment of the initial silicon wafers.
first_indexed 2025-12-07T17:56:03Z
format Article
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id nasplib_isofts_kiev_ua-123456789-118563
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
issn 1560-8034
language English
last_indexed 2025-12-07T17:56:03Z
publishDate 2010
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
record_format dspace
spelling Vlasov, S.I.
Saparov, F.A.
Ismailov, K.A.
2017-05-30T16:16:49Z
2017-05-30T16:16:49Z
2010
Effect of pressure on the characteristics of Schottky barrier diodes
 made of overcompensated semiconductor / S.I. Vlasov, F.A. Saparov, K.A. Ismailov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 4. — С. 363-365. — Бібліогр.: 10 назв. — англ.
1560-8034
PACS 61.72.-y, 85.30.Hi, Kk
https://nasplib.isofts.kiev.ua/handle/123456789/118563
We studied the effect of uniform compression on characteristics of Au–n-Si
 Schottky barrier diodes made of overcompensated semiconductor. It is shown that
 overcompensation is caused by formation of structural defects owing to thermal
 treatment of the initial silicon wafers.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Effect of pressure on the characteristics of Schottky barrier diodes made of overcompensated semiconductor
Article
published earlier
spellingShingle Effect of pressure on the characteristics of Schottky barrier diodes made of overcompensated semiconductor
Vlasov, S.I.
Saparov, F.A.
Ismailov, K.A.
title Effect of pressure on the characteristics of Schottky barrier diodes made of overcompensated semiconductor
title_full Effect of pressure on the characteristics of Schottky barrier diodes made of overcompensated semiconductor
title_fullStr Effect of pressure on the characteristics of Schottky barrier diodes made of overcompensated semiconductor
title_full_unstemmed Effect of pressure on the characteristics of Schottky barrier diodes made of overcompensated semiconductor
title_short Effect of pressure on the characteristics of Schottky barrier diodes made of overcompensated semiconductor
title_sort effect of pressure on the characteristics of schottky barrier diodes made of overcompensated semiconductor
url https://nasplib.isofts.kiev.ua/handle/123456789/118563
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AT ismailovka effectofpressureonthecharacteristicsofschottkybarrierdiodesmadeofovercompensatedsemiconductor