Effect of pressure on the characteristics of Schottky barrier diodes made of overcompensated semiconductor

We studied the effect of uniform compression on characteristics of Au–n-Si Schottky barrier diodes made of overcompensated semiconductor. It is shown that overcompensation is caused by formation of structural defects owing to thermal treatment of the initial silicon wafers.

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Bibliographic Details
Published in:Semiconductor Physics Quantum Electronics & Optoelectronics
Date:2010
Main Authors: Vlasov, S.I., Saparov, F.A., Ismailov, K.A.
Format: Article
Language:English
Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2010
Online Access:https://nasplib.isofts.kiev.ua/handle/123456789/118563
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:Effect of pressure on the characteristics of Schottky barrier diodes made of overcompensated semiconductor / S.I. Vlasov, F.A. Saparov, K.A. Ismailov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 4. — С. 363-365. — Бібліогр.: 10 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-118563
record_format dspace
spelling Vlasov, S.I.
Saparov, F.A.
Ismailov, K.A.
2017-05-30T16:16:49Z
2017-05-30T16:16:49Z
2010
Effect of pressure on the characteristics of Schottky barrier diodes made of overcompensated semiconductor / S.I. Vlasov, F.A. Saparov, K.A. Ismailov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 4. — С. 363-365. — Бібліогр.: 10 назв. — англ.
1560-8034
PACS 61.72.-y, 85.30.Hi, Kk
https://nasplib.isofts.kiev.ua/handle/123456789/118563
We studied the effect of uniform compression on characteristics of Au–n-Si Schottky barrier diodes made of overcompensated semiconductor. It is shown that overcompensation is caused by formation of structural defects owing to thermal treatment of the initial silicon wafers.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Effect of pressure on the characteristics of Schottky barrier diodes made of overcompensated semiconductor
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title Effect of pressure on the characteristics of Schottky barrier diodes made of overcompensated semiconductor
spellingShingle Effect of pressure on the characteristics of Schottky barrier diodes made of overcompensated semiconductor
Vlasov, S.I.
Saparov, F.A.
Ismailov, K.A.
title_short Effect of pressure on the characteristics of Schottky barrier diodes made of overcompensated semiconductor
title_full Effect of pressure on the characteristics of Schottky barrier diodes made of overcompensated semiconductor
title_fullStr Effect of pressure on the characteristics of Schottky barrier diodes made of overcompensated semiconductor
title_full_unstemmed Effect of pressure on the characteristics of Schottky barrier diodes made of overcompensated semiconductor
title_sort effect of pressure on the characteristics of schottky barrier diodes made of overcompensated semiconductor
author Vlasov, S.I.
Saparov, F.A.
Ismailov, K.A.
author_facet Vlasov, S.I.
Saparov, F.A.
Ismailov, K.A.
publishDate 2010
language English
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
format Article
description We studied the effect of uniform compression on characteristics of Au–n-Si Schottky barrier diodes made of overcompensated semiconductor. It is shown that overcompensation is caused by formation of structural defects owing to thermal treatment of the initial silicon wafers.
issn 1560-8034
url https://nasplib.isofts.kiev.ua/handle/123456789/118563
citation_txt Effect of pressure on the characteristics of Schottky barrier diodes made of overcompensated semiconductor / S.I. Vlasov, F.A. Saparov, K.A. Ismailov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 4. — С. 363-365. — Бібліогр.: 10 назв. — англ.
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first_indexed 2025-12-07T17:56:03Z
last_indexed 2025-12-07T17:56:03Z
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