Molodkin, V., Olikhovskii, S., Kyslovskyy, Y., Len, E., Reshetnyk, O., Vladimirova, T., . . . Lizunova, S. (2010). Double- and triple-crystal X-ray diffractometry of microdefects in silicon. Semiconductor Physics Quantum Electronics & Optoelectronics.
Chicago-Zitierstil (17. Ausg.)Molodkin, V.B, S.I Olikhovskii, Ye.M Kyslovskyy, E.G Len, O.V Reshetnyk, T.P Vladimirova, V.V V.V. Lizunov, und S.V Lizunova. "Double- and Triple-crystal X-ray Diffractometry of Microdefects in Silicon." Semiconductor Physics Quantum Electronics & Optoelectronics 2010.
MLA-Zitierstil (8. Ausg.)Molodkin, V.B, et al. "Double- and Triple-crystal X-ray Diffractometry of Microdefects in Silicon." Semiconductor Physics Quantum Electronics & Optoelectronics, 2010.
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